2016
DOI: 10.1016/j.electacta.2016.11.019
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Transient Relaxations of Ionic Conductance during Growth of Porous Anodic Alumina Films: Electrochemical Impedance Spectroscopy and Current Step Experiments

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Cited by 7 publications
(7 citation statements)
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“…In the low-frequency range (from 1 to 10 2 Hz), there is an induction loop that arises from linearization of non-linear behaviour of the system. This phenomenon can be referred to the defects relaxation in the barrier layer 26 or to the passage of charged particles against electric field gradient. 25 In the high-frequency range (from 10 2 to 10 5 Hz), a semicircle was observed.…”
Section: Resultsmentioning
confidence: 99%
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“…In the low-frequency range (from 1 to 10 2 Hz), there is an induction loop that arises from linearization of non-linear behaviour of the system. This phenomenon can be referred to the defects relaxation in the barrier layer 26 or to the passage of charged particles against electric field gradient. 25 In the high-frequency range (from 10 2 to 10 5 Hz), a semicircle was observed.…”
Section: Resultsmentioning
confidence: 99%
“…25 In the high-frequency range (from 10 2 to 10 5 Hz), a semicircle was observed. As a result, the equivalent circuit also complicates: 26 a resistor (R P ) and an in-series combination of a resistor (R L ) and an inductor (L) are connected in parallel to the capacitor (С i ) (see inset in Fig. 2).…”
Section: Resultsmentioning
confidence: 99%
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“…In serial connection to there is another electrical circuit that describes the anodic oxide layer formation through a parallel arrangement of three electrical components: the polarization resistance , which includes both the resistance of the barrier and the diffusion resistance of the pore channels, the double-layer capacity , and a serial arrangement of the resistance as well as the inductor . According to the literature, the inductive behavior can be explained by the relaxation of charge-carrying defects [ 18 ].…”
Section: Methodsmentioning
confidence: 99%
“…Houser et al 33 and Mishra et al 14 developed the quantitative viscous model for oxide growth respectively. According to the equivalent circuit, Ide et al 34 derived Nyquist plot and Alves et al 35 quantify the anodizing process.…”
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confidence: 99%