2021
DOI: 10.1063/5.0047980
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Transient performance analysis of graphene FET gated via ionic solid by numerical simulations based on tight-binding method and Nernst–Planck–Poisson equations

Abstract: We investigate the electrical transport characteristics of graphene channel field-effect transistors (FETs) gated via ionic solid (IS), where the conventional gate insulator, such as SiO2, has been replaced by solid electrolytes, such as LiP3O4. In this study, we focus on (i) the gate controllability of the current in comparison to conventional graphene FETs with SiO2 as an insulating material and (ii) the transient characteristics of the drain current and time required to switch on the current. We employ the … Show more

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Cited by 4 publications
(3 citation statements)
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“…The typical ambipolar behavior of PGFET is also observed, which is consistent with the reported graphene FETs. 40 The Dirac point V dirac is shifted to the left ∼21 mV after PLL functionalization on a channel graphene surface of the device ( Figure S5b–c ). The left shift of V dirac is due to the n-doping of the graphene by the negatively charged PLL.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The typical ambipolar behavior of PGFET is also observed, which is consistent with the reported graphene FETs. 40 The Dirac point V dirac is shifted to the left ∼21 mV after PLL functionalization on a channel graphene surface of the device ( Figure S5b–c ). The left shift of V dirac is due to the n-doping of the graphene by the negatively charged PLL.…”
Section: Resultsmentioning
confidence: 99%
“…After PLL functionalization on the graphene surface, the device resistance increases, which is due to the covalent bond interaction between PLL and graphene. The typical ambipolar behavior of PGFET is also observed, which is consistent with the reported graphene FETs . The Dirac point V dirac is shifted to the left ∼21 mV after PLL functionalization on a channel graphene surface of the device (Figure S5b–c).…”
Section: Resultsmentioning
confidence: 99%
“…To calculate the channel electrostatic potential U C ¼ ÀeV C taking the channel and the trapped charge into account, we use a capacitance model that considers the FET as a set of capacitors. 26 Figures 1 and 3 show the geometry of the FETs considered in the present study and the corresponding capacitance model that is electrostatically equivalent to Fig. 1.…”
Section: Journal Of Applied Physicsmentioning
confidence: 99%