Dark frames from orbiting infrared detector arrays are analyzed using a charge-collection model to investigate the effects of secondary and primary particle environments in infrared detectors and related electronics. The effects of different components of the primary and secondary environments are assessed by examining trends with time and pixel-to-pixel charge correlations. I. INTRODUCTION U SE OF sensitive infrared detectors in space poses significant challenges for the astronomy, military, and radiation-effects communities. These devices are designed to respond to the low levels of ionization deposited by infrared photons. This high detector sensitivity, coupled with the faintness of infrared sources typically observed by these detectors, necessitates that detectors operate at cryogenic temperatures, where charge mobilities are low and charges can become metastably trapped. As such, infrared detectors are susceptible to a rich variety of radiation effects that can be caused not just by proton-induced nuclear recoils and heavy ions but also by single low-LET (so-called minimum-ionizing) particles in the radiation environment [1]-[3]. Moreover, the faintness of most infrared sources of interest means that observations are often of long duration so there is ample opportunity for radiation effects to corrupt detector readings. Previous studies have reported significantly higher-than-expected rates of radiation-induced contamination in images Manuscript