2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) 2017
DOI: 10.23919/ispsd.2017.7988930
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Transient overvoltage induced failure of MOS-controlled thyristor under ultra-high di/dt condition

Chao Liu
1
,
Wanjun Chen
2
,
Yanling Shi
3
et al.
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Cited by 5 publications
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A Novel Insulated Gate Trigger Thyristor Integrated With Gate Transient Voltage Suppressor for Ultrahigh di/dt Pulse Switching

Liu
1
,
Zhou
2
,
Chen
3
et al. 2023
IEEE Electron Device Lett.
1
0
0
0
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A Novel Insulated Gate Trigger Thyristor Integrated With Gate Transient Voltage Suppressor for Ultrahigh di/dt Pulse Switching

Liu
1
,
Zhou
2
,
Chen
3
et al. 2023
IEEE Electron Device Lett.
1
0
0
0
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Non-Simultaneous Triggering Induced Failure of CS-MCT Under Repetitive High-Current Pulse Condition

Chen
1
,
Xin
2
,
Zhang
3
et al. 2020
IEEE Trans. Device Mater. Relib.
4
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Investigation on the Long-Term Reliability of High-Voltage p-GaN HEMT by Repetitively Transient Overcurrent

Shi
1
,
Chen
2
,
Cui
3
et al. 2018
IEEE Trans. Electron Devices
21
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6
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