2014
DOI: 10.1063/1.4882701
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Transient lateral photovoltaic effect in patterned metal-oxide-semiconductor films

Abstract: Subband gap photoresponse of nanocrystalline silicon in a metal-oxide-semiconductor device J. Appl. Phys.

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Cited by 26 publications
(30 citation statements)
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“…This unexpected behaviour has been explained by the influence of a local inductance of the Cobalt line structure, 23 in addition to a corresponding local capacitance and resistance which were previously, the only factors considered for wider LPE devices.…”
Section: Discussionmentioning
confidence: 99%
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“…This unexpected behaviour has been explained by the influence of a local inductance of the Cobalt line structure, 23 in addition to a corresponding local capacitance and resistance which were previously, the only factors considered for wider LPE devices.…”
Section: Discussionmentioning
confidence: 99%
“…We observe a substantial increase of the position sensitivity of patterned line structures when their width is reduced, measured by the peak to peak response. Preliminary results related to this part which were reported by Cascales et al 23 have been expanded and detailed in the present manuscript. In addition, we report on the substantial influence of the magnetic state on T-LPE and link it with the anisotropic magnetoresistance (AMR) of Co films.…”
Section: Introductionmentioning
confidence: 91%
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