Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry

Dávila, A.; Kaufmann, Guillermo H.; Pérez-López, Carlos

doi:10.1364/ao.37.004116

Cited by 26 publications

(11 citation statements)

References 9 publications

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“…One method of generating a carrier frequency in shearography is to translate the optical source along the optical axis between two exposures [74]. The difference in the two exposures results in a carrier fringe pattern where the frequency of the fringes is dependent on the magnitude of the translation.…”

Section: Spatial Carrier Techniquementioning

confidence: 99%

Shearography technology and applications: a review

Francis

Tatam

Groves

2010

Meas. Sci. Technol.

221

126

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Shearography is a full-field speckle interferometric technique used to determine surface displacement derivatives. For an interferometric technique, shearography is particularly resilient to environmental disturbances and has hence become an invaluable measurement tool outside of the optics laboratory. Furthermore, the inclusion of additional measurement channels has turned shearography from a qualitative inspection tool into a system suitable for quantitative surface strain measurement. In this review article we present a comprehensive overview of the technique, describing the principle of operation, optical configurations, image processing algorithms and applications, with a focus on more recent technological advances.

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Section: Spatial Carrier Techniquementioning

confidence: 99%

Shearography technology and applications: a review

Francis

Tatam

Groves

2010

Meas. Sci. Technol.

221

126

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“…It is generally considered that the temporal phase shift technique is better suited for static measurement while the spatial phase shift technique is suited more for dynamic measurement and has enormous potential for real-time display of the phase map. [21][22][23][24] Theoretically, this statement is true if a shearographic system is used under a laboratory condition. Practically, however, the spatial phase shift technique has not been accepted by commercialized shearographic NDT tools in field applications [15][16][17] because of its relative complexity in optics and a high requirement for precise adjustment of the optical setup.…”

Section: Introductionmentioning

confidence: 99%

Real-time monitoring of phase maps of digital shearography

Zhu

Wang

et al. 2013

Opt. Eng

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Abstract. Digital shearography has demonstrated great potential in direct strain measurement and, thus, has become an industrial tool for nondestructive testing (NDT), especially for NDT of delaminations and detection of impact damage in composite materials such as carbon fiber reinforced plastics and honeycomb structures. The increasing demand for high measurement sensitivity has led to the need for real-time monitoring of a digital shearographic phase map. Phase maps can be generated by applying a temporal, or spatial, phase shift technique. The temporal phase shift technique is simpler and more reliable for industry applications and, thus, has widely been utilized in practical shearographic inspection systems. This paper presents a review of the temporal phase shift digital shearography method with different algorithms and the possibility for real-time monitoring of phase maps for NDT. Quantitative and real-time monitoring of full-field strain information, using different algorithms, is presented. The potentials and limitations for each algorithm are discussed and demonstrated through examples of shearographic testing. © The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

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“…Electronic speckle--shearing pattern interferometry (ESSPI) is developed from the ESPI. Compared with other interferometries, ESSPI is robust against stability problems caused by turbulent effects in the light trajectory and also against problems that are due to reduced coherence of the illuminating source [7]. Because of mentioned-above advantages, ESSPI is widely used in industrial field.…”

Section: Introductionmentioning

confidence: 99%

Vibration analysis based on electronic stroboscopic speckle-shearing pattern interferometry

Jia

et al. 2008

SPIE Proceedings

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Copies of full items can be used for personal research or study, educational, or not-for profit purposes without prior permission or charge. Provided that the authors, title and full bibliographic details are credited, a hyperlink and/or URL is given for the original metadata page and the content is not changed in any way. Publisher's statement: Copyright notice format:Copyright 2008 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. DOI abstract link format:http://dx.doi.org/10.1117/12.806992 A note on versions: The version presented here may differ from the published version or, version of record, if you wish to cite this item you are advised to consult the publisher's version. Please see the 'permanent WRAP url' above for details on accessing the published version and note that access may require a subscription.

show abstract

Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry

Cited by 26 publications

References 9 publications

Shearography technology and applications: a review

Shearography technology and applications: a review

Real-time monitoring of phase maps of digital shearography

Vibration analysis based on electronic stroboscopic speckle-shearing pattern interferometry

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