2016
DOI: 10.1021/acs.macromol.6b02046
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Tracking Solvent Distribution in Block Polymer Thin Films during Solvent Vapor Annealing with in Situ Neutron Scattering

Abstract: Herein, we employed in situ small-angle neutron scattering (SANS) and neutron reflectivity (NR) to elucidate the importance of polymer–solvent interactions on morphology development during solvent vapor annealing (SVA) of block polymer (BP) thin films. Judicious choice of nanostructure orientation (parallel to the substrate) permitted measurement of the preferential segregation of solvent (d 6-benzene) into our cylinder-forming poly­(styrene-b-isoprene-b-styrene) (SIS) films. A distinguishing feature of this w… Show more

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Cited by 16 publications
(36 citation statements)
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“…Whereas the film thickness can be monitored readily using spectroscopic reflectometry and may be transformed into an overall solvent volume fraction in the film (or, equivalently, the polymer volume fraction, φ P ), the detailed distribution of the two solvents is not easily accessible. A recent work demonstrates that the distribution of a deuterated solvent in a nondeuterated BCP may be determined by in situ small‐angle neutron scattering (SANS) and in situ neutron reflectometry . While the significant neutron scattering contrast of deuterated and nondeuterated components is of great advantage, deuterated components (such as partially deuterated BCPs) are not always accessible.…”
Section: Introductionsupporting
confidence: 84%
See 1 more Smart Citation
“…Whereas the film thickness can be monitored readily using spectroscopic reflectometry and may be transformed into an overall solvent volume fraction in the film (or, equivalently, the polymer volume fraction, φ P ), the detailed distribution of the two solvents is not easily accessible. A recent work demonstrates that the distribution of a deuterated solvent in a nondeuterated BCP may be determined by in situ small‐angle neutron scattering (SANS) and in situ neutron reflectometry . While the significant neutron scattering contrast of deuterated and nondeuterated components is of great advantage, deuterated components (such as partially deuterated BCPs) are not always accessible.…”
Section: Introductionsupporting
confidence: 84%
“…While the significant neutron scattering contrast of deuterated and nondeuterated components is of great advantage, deuterated components (such as partially deuterated BCPs) are not always accessible. Moreover, large sample volumes and long measuring times (2 h were reported for the SANS experiments) are needed for these techniques, which may hamper an efficient screening of the parameter space, and lateral and vertical information are only obtained separately. For solvent vapor mixtures, as used in the present work, combinatorial experiments with deuterated and nondeuterated solvents or even with partially deuterated BCPs would be required.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, the Epps group has designed and fabricated experimental SVA configurations that enable in situ neutron scattering during annealing to track solvent distribution and nanoscale structural changes in BP films during treatment . Neutron scattering is particularly suited to SVA studies because sufficient contrast between solvent and both polymer blocks can be easily achieved through deuteration, which facilitates a detailed mapping of solvent segregation throughout the film .…”
Section: Block Polymer Thin Filmsmentioning
confidence: 99%
“…At low solvent content (effective T g of PS above 25 °C), the chain mobility was constrained, causing the number of layers to stay constant while the vertical domain spacing decreased. Adapted with permission . Copyright 2016, American Chemical Society.…”
Section: Block Polymer Thin Filmsmentioning
confidence: 99%
“…We note that the values of p/p 0 evaluated in this study are higher than the actual vapor pressure in the chamber because of the flow conditions. An exact way is to measure the partial pressure of solvent at each ratio using, for example, mass spectrometry at the chamber outlet, as was properly performed by Shelton et al 64 The stability of the processing conditions was monitored via measurements of the swollen films thickness h sw . The polymer volume fraction in a swollen film is estimated as: ϕ = h dr /h sw , where h dr is the thickness of the as-spin-coated and dried films.…”
Section: ■ Experimental Sectionmentioning
confidence: 99%