Track-edge read-write effect of inductive/MR dual element heads

Abstract

The effect of side-writing from the inductive writer on the read-back properties of M R heads is studied by recording physics analysis and micromagnetic simulation.Inductive write heads with and without pole trimming, and MR read heads with overlay and contiguous-junction designs are investigated. It is found that the contiguous-junction M R reader is robust against written track-edge perturbations, and in general, track-trimming for both the write head and the read sensor is beneficial for optimum performance.