Trace Elemental Analysis of Illicit Methamphetamines Using Total Reflection X-Ray Fluorescence Spectroscopy

Muratsu, Seiji; Fukui, Sadao; Maeda, Toyonaga; Matsushita, T.; Hasegawa, Hiromu; Sakurai, Yoshinori; Shimoda, Osamu; Kaizaki, Sumio; Ninomiya, Toshio

doi:10.1248/jhs.45.166

Cited by 3 publications

(2 citation statements)

References 4 publications

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“…inductively couple plasma-mass spectroscopy (ICP-MS) for MDMA [10][11][12], methamphetamine [4,13] and heroin [14]; ion chromatography (IC) for methamphetamine [13]; total reflection X-ray fluorescence analysis (TXRF) for methamphetamines [15]; synchrotron radiation total reflection X-ray fluorescence analysis (SR-TXRF) for a range of drugs of abuse [16]; electrochemical methods for ecstasy [17].…”

Section: Introductionmentioning

confidence: 99%

Graphite furnace atomic absorption elemental analysis of ecstasy tablets

French

Went

Gibson

2013

Forensic Science International

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Six metals (Cu, Mg, Ba, Ni, Cr, Pb) were determined in two separate batches of seized ecstasy tablets by graphite furnace atomic absorption spectroscopy (GFAAS) following digestion with nitric acid and hydrogen peroxide. Large intra-batch variations were found as expected for tablets produced in clandestine laboratories. For example, nickel in batch 1 was present in the range 0.47-13.1 ppm and in batch 2 in the range 0.35-9.06 ppm. Although batch 1 had significantly higher MDMA content than batch 2, barium was the only element which discriminated between the two ecstasy seizures (batch 1: 0.19-0.66 ppm, batch 2: 3.77-5.47 ppm).

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Section: Introductionmentioning

confidence: 99%

Graphite furnace atomic absorption elemental analysis of ecstasy tablets

French

Went

Gibson

2013

Forensic Science International

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“…Emily Cook characterized drugs in the parcels using energy dispersive X-ray diffraction (EDXRD) [2]. Although some literatures related to the case of detecting and identifying drugs [3][4][5][6][7][8][9][10][11], identifying the hidden drugs in body via the energy dispersive X-ray diffraction (EDXRD) and Coherence Function are rarely concerned.…”

Section: Introductionmentioning

confidence: 99%

Identification of Heroin Covered by Simulation Skin Using Energy Dispersive X-ray Diffraction and Coherence Function

Zhang

Chang

et al. 2010

2010 International Conference on Electrical and Control Engineering

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An inspection technique based on energy dispersive X-ray diffraction (EDXRD) has been developed to provide chemically specific detection of samples. Implementing this technique and coupling with appropriate analysis algorithm provide specific material identification. Profile analysis has been performed using the Coherence Function. The Results suggest that it is feasible to recognize heroin covered by simulation skin through coherence function analysis method. Meanwhile, the coherence coefficient can also be made as criterion of characteristic signal recognization. Thus, heroin in the body may be identified automatically through this kind of technique.

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Trace Elemental Analysis of Drugs of Abuse Using Synchrotron Radiation Total Reflection X-Ray Fluorescence Analysis (SR-TXRF)

Muratsu

Ninomiya

Kagoshima

et al. 2002

Journal of Forensic Sciences

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Synchrotron radiation total reflection X-ray fluorescence spectroscopy (SR-TXRF) was utilized to analyze various trace elements in small amounts of drugs of abuse. Sample amounts of 1 L solutions containing 10 g of drugs (methamphetamine, amphetamine, 3,4-methylene-dioxymethamphetamine, cocaine, and heroin) were spotted on silicon wafers for direct analysis. In addition, a leaflet of marijuana was set directly on a silicon wafer, and opium in the form of a soft lump was smeared on another silicon wafer for analysis. In these experiments, about 10 pg of contaminant elements could be detected. For example, in a seized methamphetamine sample, iodine was found, which could be indicative of syn-thetic route. In seized 3,4-methylenedioxymethamphetamine samples, variable amounts of phosphorus, calcium, sulfur, and potassium were found, which could not be detected in a control 3,4-methylenedioxymethamphetamine sample. For marijuana and opium, two spectral patterns were ob-tained that were far different from each other and could be easily discriminated. Using SR-TXRF, pg amounts of each trace element in 10 g of var-ious drugs can be easily detected, which is not the case either for a standard TXRF experimental system or for other elemental analysis techniques.

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Trace Elemental Analysis of Illicit Methamphetamines Using Total Reflection X-Ray Fluorescence Spectroscopy

Cited by 3 publications

References 4 publications

Graphite furnace atomic absorption elemental analysis of ecstasy tablets

Graphite furnace atomic absorption elemental analysis of ecstasy tablets

Identification of Heroin Covered by Simulation Skin Using Energy Dispersive X-ray Diffraction and Coherence Function

Trace Elemental Analysis of Drugs of Abuse Using Synchrotron Radiation Total Reflection X-Ray Fluorescence Analysis (SR-TXRF)

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