1998
DOI: 10.1016/s0003-2670(98)00267-0
|View full text |Cite
|
Sign up to set email alerts
|

Trace element profile of semiconductor materials: Gallium and arsenic

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
6
0

Year Published

1999
1999
2017
2017

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 8 publications
(6 citation statements)
references
References 19 publications
0
6
0
Order By: Relevance
“…The separation of inorganic matrix elements, namely Ga and As, on similar grounds is a difficult task. Although matrix separation methods based on solvent extraction and ion-exchange are reported, [4][5][6] volatilization of Ga and As as their chlorides gained much attention due to its simplicity and retention of larger number of analytes. 7,8 In recent years vapor phase pretreatment of samples is being used widely to reduce process blank levels.…”
Section: Introductionmentioning
confidence: 99%
“…The separation of inorganic matrix elements, namely Ga and As, on similar grounds is a difficult task. Although matrix separation methods based on solvent extraction and ion-exchange are reported, [4][5][6] volatilization of Ga and As as their chlorides gained much attention due to its simplicity and retention of larger number of analytes. 7,8 In recent years vapor phase pretreatment of samples is being used widely to reduce process blank levels.…”
Section: Introductionmentioning
confidence: 99%
“…The devices as currently configured can be applied in quality control of nuclear materials, and can be used to preserve the native nuclear and trace element signatures during nuclear forensic analysis. We envision that by changing the ion-specific resins and elution sequences described in this paper, this same platform can be used in other matrix removal applications, such as trace element analyses in high-purity arsenic [13], gallium [14], tungsten [15] and in meteoritic iron [16] samples. Additionally, this flexible microcolumn design can be incorporated into more complex devices for higher throughput or automated operations.…”
Section: Discussionmentioning
confidence: 99%
“…Insert Figure 1 here This flexible, miniaturized platform can be incorporated into more complex devices to provide complete lab-on-a-chip systems. With suitable choice of resin and reagents, the microcolumn design can be adapted for solid-phase extraction supporting trace element assay in various other sample types, such as high purity metals and meteorites [13][14][15][16].…”
Section: Introductionmentioning
confidence: 99%
“…An ion-exchange methodology for the determination of trace elements in high-purity Ga, As, As oxides and mixtures of Ga and As has been reported. 171 The analytes pre-concentrated by dissolving 0.5±2 g of the matrix in acid or alkali followed by separation on Dowex 1X8 (50±100 mesh) or Chelex 100 (50± 100 mesh). The desorbed elements were quanti®ed by ETAAS, FAAS, FAES, NAA and ICP-AES.…”
Section: Semiconductors and Conducting Materialsmentioning
confidence: 99%