“…It is also possible to scan the sample surface with the x-ray beam by deflecting Electron Microprobes (Figure 1). The electron microprobe first described by Castaing (61) has proved increasingly useful and has stimulated the development of similar laboratory (27, 31,43,66,72,84,168,186,215) and commercial instruments ( Table 11). All of the microprobes contain three standard components: an electron-optical system (usually that of an electron microscope) , an optical microscope, and an x-ray spectrometer.…”