1954
DOI: 10.1038/174397a0
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Trace Analysis by X-Ray Emission Spectrography

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Cited by 53 publications
(10 citation statements)
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“…Trace determinations divide themselves logically into those where the traces are major constituents (samples small in mass) and those n here the traces are minor constituents (qaniples possibly large). The first class is governed by the considerations involved in determining film thickness (130) and is exemplified by n-ork nith spots (85,168,219); the second differs from the first in that deviations from proportionality on in6 to absorption and enhancement effects (130) are much more likely.…”
Section: Applications Work On Elementsmentioning
confidence: 99%
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“…Trace determinations divide themselves logically into those where the traces are major constituents (samples small in mass) and those n here the traces are minor constituents (qaniples possibly large). The first class is governed by the considerations involved in determining film thickness (130) and is exemplified by n-ork nith spots (85,168,219); the second differs from the first in that deviations from proportionality on in6 to absorption and enhancement effects (130) are much more likely.…”
Section: Applications Work On Elementsmentioning
confidence: 99%
“…It is also possible to scan the sample surface with the x-ray beam by deflecting Electron Microprobes (Figure 1). The electron microprobe first described by Castaing (61) has proved increasingly useful and has stimulated the development of similar laboratory (27, 31,43,66,72,84,168,186,215) and commercial instruments ( Table 11). All of the microprobes contain three standard components: an electron-optical system (usually that of an electron microscope) , an optical microscope, and an x-ray spectrometer.…”
Section: Microprobesmentioning
confidence: 99%
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“…A common method for preconcentrating trace elements to improve XRF detection limits is to cast a sample solution in microliter-sized spots that are then dried (Pfeiffer and Zemany, 1954; Murata and Murokado, 1982; Murata et al , 1984; Meltzer and King, 1991; Colletti and Havrilla, 1997; Link et al , 2002). In the current work, a dried residue casting process was used to prepare dry specimens from liquid samples.…”
Section: Introductionmentioning
confidence: 99%
“…A common method for preconcentrating trace elements to improve XRF detection limits is to cast a sample solution in microliter sized spots that are then dried [5][6][7][8][9][10]. In the current work, a dried residue casting process was used to prepare dry specimens from liquid samples.…”
Section: Introductionmentioning
confidence: 99%