Towards to Theory of the X-ray Diffraction Tomography of Crystals with Nano-Sized Defects
V. A. Grigorev,
P. V. Konarev,
F. N. Chukhovskii
et al.
Abstract:X-ray diffraction tomography is an innovative method that is widely used to obtain 2D-phase-contrast diffraction images and their subsequent 3D-reconstruction of structural defects in crystals. The most frequent objects of research are linear and helical dislocations in a crystal, for which plane wave diffraction images are the most informative, since they do not contain additional interference artifacts unrelated to the images of the defects themselves. In this work the results of modeling and analysis of 2D … Show more
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