Towards Robust Process Design Kits with a Scalable DevOps Quality Assurance Platform

Datsuk, A.; Ostrovskyy, P.; Vater, F.; Wieden, C.

doi:10.1109/vlsi-soc57769.2023.10321846

2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC) 2023

DOI: 10.1109/vlsi-soc57769.2023.10321846

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Towards Robust Process Design Kits with a Scalable DevOps Quality Assurance Platform

A. Datsuk,

P. Ostrovskyy,

F. Vater

et al.

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Towards Robust Process Design Kits with a Scalable DevOps Quality Assurance Platform

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References 5 publications

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