Towards Quantitative Nanomagnetism in Transmission Electron Microscope by the Use of Patterned Apertures

Ali, Hasan; Warnatz, Tobias; Xie, Ling; Hjörvarsson, Bjørgvin; Leifer, Klaus

doi:10.1017/s1431927619004008

Cited by 2 publications

(2 citation statements)

References 6 publications

(6 reference statements)

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“…This enables the determination of the effect of crystal tilt on the measured EMCD signal with high accuracy. By inserting a custom-made quadruple aperture (QA) 25 in the reciprocal space plane of the electron beam trajectory, we simultaneously obtain four angle-resolved spectroscopic signals in a single acquisition. The four signals include the two conjugate EELS spectra required for the EMCD measurements and the inelastic intensities of the 0 and the g beams (in 2-beam orientation).…”

Section: Introductionmentioning

confidence: 99%

“…Here we introduce a technique to simultaneously map the EMCD signals and the local orientations of the sample in a single scan of the electron beam. By inserting a custom-made quadruple aperture (QA) [25] in the reciprocal space plane of the electron beam trajectory, we simultaneously obtain four angle-resolved spectroscopic signals in a single acquisition. The four signals include the two magnetic components required for the EMCD measurements and the inelastic intensities of the 0 and the g beams.…”

Section: Introductionmentioning

confidence: 99%

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Simultaneous mapping of EMCD signals and crystal orientations in a transmission electron microscope

Ali

Rusz

Warnatz

et al. 2021

Sci Rep

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When magnetic properties are analysed in a transmission electron microscope using the technique of electron magnetic circular dichroism (EMCD), one of the critical parameters is the sample orientation. Since small orientation changes can have a strong impact on the measurement of the EMCD signal and such measurements need two separate measurements of conjugate EELS spectra, it is experimentally non-trivial to measure the EMCD signal as a function of sample orientation. Here, we have developed a methodology to simultaneously map the quantitative EMCD signals and the local orientation of the crystal. We analyse, both experimentally and by simulations, how the measured magnetic signals evolve with a change in the crystal tilt. Based on this analysis, we establish an accurate relationship between the crystal orientations and the EMCD signals. Our results demonstrate that a small variation in crystal tilt can significantly alter the strength of the EMCD signal. From an optimisation of the crystal orientation, we obtain quantitative EMCD measurements.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Simultaneous mapping of EMCD signals and crystal orientations in a transmission electron microscope

Ali

Rusz

Warnatz

et al. 2021

Sci Rep

Self Cite

View full text Add to dashboard Cite

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A revew of in situ transmission electron microscopy study on the switching mechanism and packaging reliability in non-volatile memory

et al. 2021

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Non-volatile memory (NVM) devices with non-volatility and low power consumption properties are important in the data storage field. The switching mechanism and packaging reliability issues in NVMs are of great research interest. The switching process in NVM devices accompanied by the evolution of microstructure and composition is fast and subtle. Transmission electron microscopy (TEM) with high spatial resolution and versatile external fields is widely used in analyzing the evolution of morphology, structures and chemical compositions at atomic scale. The various external stimuli, such as thermal, electrical, mechanical, optical and magnetic fields, provide a platform to probe and engineer NVM devices inside TEM in real-time. Such advanced technologies make it possible for an in situ and interactive manipulation of NVM devices without sacrificing the resolution. This technology facilitates the exploration of the intrinsic structure-switching mechanism of NVMs and the reliability issues in the memory package. In this review, the evolution of the functional layers in NVM devices characterized by the advanced in situ TEM technology is introduced, with intermetallic compounds forming and degradation process investigated. The principles and challenges of TEM technology on NVM device study are also discussed.

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Towards Quantitative Nanomagnetism in Transmission Electron Microscope by the Use of Patterned Apertures

Cited by 2 publications

References 6 publications

Simultaneous mapping of EMCD signals and crystal orientations in a transmission electron microscope

Simultaneous mapping of EMCD signals and crystal orientations in a transmission electron microscope

A revew of in situ transmission electron microscopy study on the switching mechanism and packaging reliability in non-volatile memory

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