Towards a new generation of Monolithic Active Pixel Sensors

Chauhan, Ankur; Eckstein, D.; Feindt, F.; Gregor, I. M.; Hansen, Karsten; Huth, Lennart; Mendes, Larissa Helena; Mulyanto, Budi; Rastorguev, D. L.; Reckleben, Christian; Daza, Sara Ruiz; Schütze, P.; Simancas, Adriana; Spannagel, S.; Stanitzki, M. M.; Velyka, A.; Vignola, Gianpiero; Wennlöf, Håkan

doi:10.1016/j.nima.2022.167821

Cited by 1 publication

(1 citation statement)

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“…Joint contributions have taken place for their characterization, as well as generic simulations validating process modifications for enhanced sensor performance. A test chip featuring a Krummenacher type charge sensitive amplifier designed at DESY was characterized in [5]. The ALICE Analog Pixel Test Structure (APTS) prototype [6] is an analog prototype designed to characterize different sensor layouts and has been designed as part of the ALICE ITS3 upgrade efforts.…”

Section: Introductionmentioning

confidence: 99%

Developing a Monolithic Silicon Sensor in a 65nm CMOS Imaging Technology for Future Lepton Collider Vertex Detectors

Simancas,

Braach,

Buschmann

et al. 2022

2022 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

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Monolithic CMOS sensors in a 65 nm imaging technology are being investigated by the CERN EP Strategic R&D Programme on Technologies for Future Experiments for an application in particle physics. The appeal of monolithic detectors lies in the fact that both sensor volume and readout electronics are integrated in the same silicon wafer, providing a reduction in production effort, costs and scattering material. The Tangerine Project WP1 at DESY participates in the Strategic R&D Programme and is focused on the development of a monolithic active pixel sensor with a time and spatial resolution compatible with the requirements for a future lepton collider vertex detector. By fulfilling these requirements, the Tangerine detector is suitable as well to be used as telescope planes for the DESY-II Test Beam facility. The project comprises all aspects of sensor development, from the electronics engineering and the sensor design using simulations, to laboratory and test beam investigations of prototypes. Generic TCAD Device and Monte-Carlo simulations are used to establish an understanding of the technology and provide important insight into performance parameters of the sensor. Testing prototypes in laboratory and test beam facilities allows for the characterization of their response to different conditions. By combining results from all these studies it is possible to optimize the sensor layout. This contribution presents results from generic TCAD and Monte-Carlo simulations, and measurements performed with test chips of the first sensor submission.

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Section: Introductionmentioning

confidence: 99%