Towards a mixed-signal testability bus standard P1149.4

A digital partial built-in self-test structure for a high performance automatic gain control circuit

“…Several DfT studies have been published, including work on a current mode DAC where test vectors are optimised and redundancies removed [11], on analogue filters where the controllability and observability is improved to test a number of stages separately [12,13,14] and on flash ADC [15,16]. Motivated by the success of the 1149.1 scan bus, the IEEE Mixed-Signal Testability Bus Standard P1149.4 has been developed [17,18] which is likely to radically improve test access at the system level. The Analogue Circuit Observer Block [19] reduces the need for precision by encoding the data during circuit test.…”

Application of Dynamic Supply Current Monitoring to Testing Mixed‐Signal Circuits

“…In its present form, the time-domain testing approach is unlikely to lead to a complete unified test solution for complex mixed-signal circuits due, for example, to a reduction in the PRBS signal resolution and change in its characteristics. However, the technique is expected to be of substantial benefit when used in conjunction with the mixed-signal test bus [23] or other analogue built-in self test techniques [24]. Authors…”

Mixed-signal circuit testing-A review

“…This motivated the development of an alternative structure using analog multiplexers [17,18] which alleviate the error effects. The design concept of combining analog multiplex-ing and demultiplexing to analog inputs and outputs has been extended to develop analog test bus [20].…”