Toward Understanding the Failure Mechanism in p-GaN Gate HEMTs Operating in Reverse Conduction Diode Mode

Lin, Wei-Syuan; Bakeroot, Benoit; Huang, Zhen-Hong; Lo, Ting-Chun; Borga, Matteo; Wellekens, Dirk; Posthuma, Niels; Decoutere, Stefaan; Wu, Tian-Li

doi:10.1109/ted.2024.3412095

IEEE Trans. Electron Devices

2024

DOI: 10.1109/ted.2024.3412095

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Toward Understanding the Failure Mechanism in p-GaN Gate HEMTs Operating in Reverse Conduction Diode Mode

Wei-Syuan Lin,

Benoit Bakeroot,

Zhen-Hong Huang

et al.

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Toward Understanding the Failure Mechanism in p-GaN Gate HEMTs Operating in Reverse Conduction Diode Mode

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