2012
DOI: 10.1109/jstqe.2011.2171674
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Toward Spectral-Domain Optical Coherence Tomography on a Chip

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Cited by 54 publications
(45 citation statements)
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“…It is attractive for use in optical wavelength-division-multiplexed networks but also for application to various other spectroscopic measurements, e.g. optical coherence tomography (OCT) [2] and Raman spectroscopy [3], or for confocal light delivery and collection [4]. There is a strong need for AWGs with low-loss and box-like passbands over a broad spectral range.…”
Section: Introductionmentioning
confidence: 99%
“…It is attractive for use in optical wavelength-division-multiplexed networks but also for application to various other spectroscopic measurements, e.g. optical coherence tomography (OCT) [2] and Raman spectroscopy [3], or for confocal light delivery and collection [4]. There is a strong need for AWGs with low-loss and box-like passbands over a broad spectral range.…”
Section: Introductionmentioning
confidence: 99%
“…This is to facilitate the reflection of incident light perpendicular to the surface of the Si wafer. Together with vertical sidewalls, 45° angled sidewalls can be used to reflect light to form complicated structures that facilitate interferometric imaging [2]. …”
Section: Introductionmentioning
confidence: 99%
“…High index contrast silicon-on-insulator platform has been chosen for planar waveguide devices working above 1 100 nm [3,4] , which is the absorption edge of silicon, whereas the silicon oxynitride (SiON) waveguide platform for wavelength range below 1 100 nm is favorable because of its variable refractive index (from 1.47 to 2.3) and broad highly transparent wavelength range (210 nm to 2 000 nm) [5] . SiON waveguide based AWG spectrometers have been recently reported, especially for Raman spectroscopy [6] and optical coherence tomography [7,8] . Compared with AWG, EDG is significantly smaller because a folded beam path is used.…”
mentioning
confidence: 99%