2003
DOI: 10.1109/jstqe.2003.814191
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Toward nanometer-scale resolution in fluorescence microscopy using spectral self-interference

Abstract: We introduce a new fluorescence microscopy technique that maps the axial position of a fluorophore with subnanometer precision. The interference of the emission of fluorophores in proximity to a reflecting surface results in fringes in the fluorescence spectrum that provide a unique signature of the axial position of the fluorophore. The nanometer sensitivity is demonstrated by measuring the height of a fluorescein monolayer covering a 12-nm step etched in silicon dioxide. In addition, the separation between f… Show more

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Cited by 38 publications
(30 citation statements)
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“…The second technique, SSFM (20), is an interferometric technique in fluorescent imaging that analyzes the spectral oscillations emitted by a fluorophore located on a layered reflecting surface and yields a precise position determination (Fig. 1).…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…The second technique, SSFM (20), is an interferometric technique in fluorescent imaging that analyzes the spectral oscillations emitted by a fluorophore located on a layered reflecting surface and yields a precise position determination (Fig. 1).…”
Section: Resultsmentioning
confidence: 99%
“…At larger distances, even a small shift in wavelength leads to sharp changes in the intensity of emitted light. The result was a shorter distance between interference peaks, about four to five peaks in the typical emission spectrum of an organic dye located 10-15 wavelengths above the mirror (20).…”
Section: Methodsmentioning
confidence: 98%
See 1 more Smart Citation
“…There are several ways in which the diffraction limit can be overcome in fluorescence microscopy due to the specific nature of fluorescence. Such methods include two-photon microscopy, 4Pi confocal microscopy, standing-wave excitation, emission and excitation interferences, stimulated emission depletion (STED) technique, and combined STED with 4Pi microscopy (Swan et al, 2003;Dyba & Hell, 2002;Hell, 2004;Dyba et al, 2005). Optical resolutions as high as 33 nm have been reported (Dyba & Hell, 2002).…”
Section: Sub-wavelength Fluorescence Microscopymentioning
confidence: 99%
“…The broader the emission spectrum, the more information is collected and the more precise the height determination. The distance above the mirror can be determined solely from the oscillations within the spectrum 3 . The axial position of the fluorophores is encoded in the spectral oscillations and not in the overall intensity; therefore, variations in fluorophore density, emission intensity, and the excitation field strength will not affect the apparent axial position.…”
Section: Introductionmentioning
confidence: 99%