Toward control of point defects in lithium fluoride thin layers

Abstract

PACS 61.72. Ji, 68.55.Ln, 78.20.Ci Point defect formation and stabilization properties, as well as their peculiar spectroscopic characteristics, locally modify the optical properties of insulating materials. Thin layers containing high concentrations of colour centres, hosted in a LiF single crystal and/or a polycrystalline matrix, offer the opportunity to develop innovative light-emitting photonic devices. Control of all the critical parameters should be required on spatial dimension comparable with the optical wavelengths. Recent developments in laser technologies, electron and particles beam methods, and novel photon sources, have opened a wide range of opportunities. An overview of the most significant advances in this field is provided, with particular emphasis on colour-centre LiF-based innovative miniaturised light sources, optical amplifiers and lasers.