“…Of particular interest were the decomposition voltages (i.e., stability windows) and nature of passivation films in terms of chemical composition and physical structure. The techniques utilized included atomic force microscopy (AFM), ,, infrared spectroscopies, − electrochemical impedance spectroscopy, ,− electrochemical quartz crystal microbalance, , X-ray photoelectron spectroscopy (XPS), − ,,,,,− secondary ion mass spectroscopy (SIMS), ,, grazing incidence X-ray scattering, and X-ray reflectivity (XRR) …”