Toward a BITE for Real-Time Life Estimation of Capacitors Subjected to Thermal Stress

Albertini, A; Masi, Maria Gabriella; Mazzanti, G.; Peretto, Lorenzo; Tinarelli, Roberto

doi:10.1109/tim.2010.2102392

Cited by 17 publications

(7 citation statements)

References 8 publications

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“…In order to reduce the occurrence of failures in MV cable joints, it is of major importance to understand the mechanisms leading to loss of insulation. This can be obtained by specific measurement campaigns aimed at investigating the causes of fault, as is typically done for all electrical assets (e.g., instrument transformers [5][6][7][8], overhead lines [9,10], insulators [11][12][13], capacitors, [14] etc.). Good insulation depends on several factors, such as, for a certain voltage level, interface pressure and surface smoothness, materials, manufacturing, and installation.…”

Section: Introductionmentioning

confidence: 99%

Effects of Thermal Cycles on Interfacial Pressure in MV Cable Joints

Sante

Ghaderi

Mingotti

et al. 2019

Sensors

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The use of medium voltage cable joints is mandatory when dealing with power cable faults and the installation of new lines. However, such an accessory is among the top causes of faults among the grid. To this purpose, one of the quantities monitored to understand the causes of such faults is the interfacial pressure between the insulating layers of the cable joint. In this work, the interfacial pressure between Cross-linked polyethylene (XLPE) and silicon rubber has been evaluated when the cable joint experiences thermal cycles. From the results, the pressure variation caused by the thermal cycles is demonstrated. Such a phenomenon may be connected to the generation of voids and weak spots that accelerate cable joint ageing. Therefore, proper comments and conclusions are drawn.Sensors 2020, 20, 169 2 of 13 delta at ambient temperature. The same setup is then used to perform measurements in the 5-60 • C temperature range [25]. The experiments demonstrated a relationship between the temperature and the tangent delta, affecting the cable joint service life. In [26,27], different Tanδ extraction methods are presented.The pressure between the insulating elements and the cable joint is also believed to affect the insulation effectiveness provided by the cable joint. The selection of materials plays a relevant role in this respect [28]. A method is available in literature to calculate and simulate the surface pressure [29]. The correlation between the interfacial pressure and tangent delta has been explored in [30]. The variation of the interfacial pressure with the ambient temperature was also investigated [31].As for the PD, they are considered by several experts to be an effective method to assess the "healthy" status of the cable joints. Therefore, literature provides a high number of studies on this topic. For example, new PD extraction and analysis methods are presented in [32,33], while an on-line measurement setup is described in [34]. Based on these works [30,31], a correlation between the three physical parameters involved can be established.In light of the above mentioned, the aim of this paper is to measure and evaluate the interfacial pressure between XLPE and SR when subject to thermal cycles. Such cycles aim at reproducing the ambient temperature variations that a cable joint suffers during its working life. From the results, compared also with the current literature, it can be appreciated a typical behavior, due in this case by the thermal cycles, that is cause of ageing acceleration of cable joints (as detailed below).The paper is structured as follows. In Section 2 the measurement setup and the details of its elements are described. The experimental tests are described in Section 3, while Section 4 is dedicated to the results analysis and comparison with consistent literature. In Section 5, comments on the obtained results and conclusion are drawn.

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Section: Introductionmentioning

confidence: 99%

Effects of Thermal Cycles on Interfacial Pressure in MV Cable Joints

Sante

Ghaderi

Mingotti

et al. 2019

Sensors

Self Cite

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“…Albertini et al [36] investigate a thermal life model for capacitors subjected to both constant and time-varying temperatures. The constanttemperature life models are based on the Arrhenius model and an Arrhenius-Miner Model is proposed for lifetime calculation under timevarying temperature stress.…”

Section: Degradation Modeling 31 Metallized Film Capacitorsmentioning

confidence: 99%

“…Regarding voltage and humidity dependency, an inverse power law or an exponential law is generally used [1] [35][36][37][38]. An example of a degradation life model simply obtained by multiplying the aging rates of each stress is given in Eq.…”

Section: Degradation Modeling 31 Metallized Film Capacitorsmentioning

confidence: 99%

A Review of Degradation Behavior and Modeling of Capacitors

Gupta

Yadav

DeVoto

et al. 2018

ASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystem

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This paper firstly reviews the failure causes, modes and mechanisms of two major types of capacitors used in power electronic systems — metallized film capacitors and electrolytic capacitors. The degradation modeling related to these capacitors is then presented. Both physics-of-failure and data-driven degradation models for reliability and lifetime estimation are discussed. Based on the exhaustive literature review on degradation modeling of capacitors, we provide a critical assessment and future research directions.

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“…The input parameters include the failure rates and repair times of all inverter components including IGBT, diode, capacitor and digital controller. The three reliability parameters are the functions of component temperatures and thus the functions of power flow through the PV inverter and voltage level [16]- [22].…”

Section: A Reliability Evaluation Of Pv Invertermentioning

confidence: 99%

Comparative analysis of the reliability of grid-connected photovoltaic power systems

Wang

Zhang

et al. 2012

2012 IEEE Power and Energy Society General Meeting

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This study compares the reliability performance of string inverter structure and central inverter structure for gridtied solar photovoltaic (PV) systems. The impact of input power variation and ambient-conditions on failure rates of PV system components are quantified and incorporated in the reliability analysis. Aging failure in PV panels is also modeled to evaluate the life cycle reliability of both types of PV systems. Sensitivity analyses are extensively conducted to explore the impact of different factors on the performances of different PV systems. Test results on a practical 20 kW PV project are presented to demonstrate the effectiveness of the presented method. He is a Fellow of IEEE and Canadian Academy of Engineering, and an honorable advisory professor at Chongqing University in China. He has published five books and over 135 papers in power system planning, probabilistic applications and reliability. He has received several IEEE awards including the IEEE PES Roy Billinton Power System Reliability Award in 2011. Nadim Kan'an received the M.Sc. degree from Masdar Institute of Science and Technology, UAE. He is currently working toward the Ph.D. degree at the University of Connecticut, Storrs. His research area includes photovoltaic power systems, microgrid control, and real-time simulation.

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Toward a BITE for Real-Time Life Estimation of Capacitors Subjected to Thermal Stress

Cited by 17 publications

References 8 publications

Effects of Thermal Cycles on Interfacial Pressure in MV Cable Joints

Effects of Thermal Cycles on Interfacial Pressure in MV Cable Joints

A Review of Degradation Behavior and Modeling of Capacitors

Comparative analysis of the reliability of grid-connected photovoltaic power systems

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