Total Reflection Xray Fluorescence (TXRF) spectrometry as a powerful and broad-spectrum analytical tool in the nuclear sciences

Abstract

X-ray spectroscopy is widely used in nuclear reaction and structure studies. To aid such studies the technological envelope is continually being pushed to achieve higher quality such as superior power and brilliance, higher resolution and sensitivity. We present the discussion of a relatively new form of X-ray fluorescence spectrometry - Total Reflection X-ray Fluorescence (TXRF) spectrometry that can achieve analytical sensitivities of the order of parts per billion (ppb). An overview of the TXRF technique is presented and its utility for nuclear materials analysis discussed. Polarized Energy Dispersive X-ray Fluorescence (PEDXRF) spectrometry is also an XRF technique that can complement TXRFS where it may not be applicable. That scenario is discussed with respect to our results using PEDXRF on geothermal samples that serve to corroborate the recent findings of the Borexino Geoneutrino Experiment regarding the high Th, U concentrations in the earth’s mantle.