Total reflection coefficients of low-energy photons presented as universal functions

Abstract

The possibility of expressing the total particle and energy reflection coefficients of low-energy photons in the form of universal functions valid for different shielding materials is investigated in this paper. The analysis is based on the results of Monte Carlo simulations of photon reflection by using MCNP, FOTELP, and PENELOPE codes. The normal incidence of the narrow monoenergetic photon beam of the unit intensity and of initial energies from 20 keV up to 100 keV is considered, and particle and energy reflection coefficients from the plane homogenous targets of water, aluminum, and iron are determined and compared. The representations of albedo coefficients on the initial photon energy, on the probability of large-angle photon scattering, and on the mean number of photon scatterings are examined. It is found out that only the rescaled albedo coefficients dependent on the mean number of photon scatterings have the form of universal functions and these functions are determined by applying the least square method

Integral particle reflection coefficient for oblique incidence of photons as universal function in the domain of initial energies up to 300 keV

“…We have made an at tempt to an a lyze the oblique pho ton in ci dence us ing the ap proach and meth od ology ap plied for the nor mal in ci dence, de scribed in [7,10,11,13]. It is based on a three di men sional model of a pla nar thick slab of ma te rial which is a tar get for a nar row beam of monoenergetic pho tons.…”

“…This means that a sin gle func tion can de scribe reflec tion of one type of par ti cles from dif fer ent tar get ma te ri als and for dif fer ent par ti cle en er gies. Num ber of pa pers have been pub lished on this topic [3,[5][6][7][8][9][10][11].…”

“…In the pre vi ous ten years the au thors pub lished sev eral pa pers [7][8][9][10][11]13], in which anal y ses of pho ton re flec tion were done and the uni ver sal be hav ior of the in te gral re flec tion co ef fi cients was ex plored, based on the re sults of the Monte Carlo sim u la tions of pho ton trans port in a set of ma te ri als of in ter est. Those anal yses cov ered the do main of in ci dent pho ton en er gies up to 300 keV and were lim ited to nor mal pho ton in cidence only.…”

Investigation of Albedo Factor Parameters in Some Selected Sn Compounds

“…The photon reflection capability of the target sample is called an albedo factor and is related to the atomic number, thickness, and incident x-ray photon energy [2]. Each target's derived albedo factor values are used in manufacturing radiation shielding material [3][4][5][6][7][8]. For this purpose, different materials used or recommended in the industry have been researched by various researchers and brought to the literature.…”