2010
DOI: 10.1016/j.nimb.2009.09.053
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Total pattern fitting for the combined size–strain–stress–texture determination in thin film diffraction

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Cited by 983 publications
(509 citation statements)
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“…30 X-ray diffraction (XRD) analysis of ZnO NPs and reaction samples was performed in reflection mode on an X'Pert PRO MPD (PANalytical) diffractometer using a CuKα (λ = 0.154 nm) radiation in the 2θ scanning range of 5−80°. The XRD patterns were refined according to the Rietveld method with the material analysis using the diffraction (MAUD) program package 31,32 Environmental Science & Technology ZnO NPs used in this study were mainly spherical in shape with an average particle size of 40 ± 11 nm (size distribution is provided in Figure S1 in Supporting Information) obtained by measuring about 200 single nanoparticles. The isoelectric point (IEP) of ZnO NPs was 9.1, indicative of positive surface charges at pH < 9.1.…”
Section: ■ Materials and Methodsmentioning
confidence: 99%
“…30 X-ray diffraction (XRD) analysis of ZnO NPs and reaction samples was performed in reflection mode on an X'Pert PRO MPD (PANalytical) diffractometer using a CuKα (λ = 0.154 nm) radiation in the 2θ scanning range of 5−80°. The XRD patterns were refined according to the Rietveld method with the material analysis using the diffraction (MAUD) program package 31,32 Environmental Science & Technology ZnO NPs used in this study were mainly spherical in shape with an average particle size of 40 ± 11 nm (size distribution is provided in Figure S1 in Supporting Information) obtained by measuring about 200 single nanoparticles. The isoelectric point (IEP) of ZnO NPs was 9.1, indicative of positive surface charges at pH < 9.1.…”
Section: ■ Materials and Methodsmentioning
confidence: 99%
“…In order to obtain temperature variation of the lattice parameter the Rietveld refinement was done for every temperature step (sequential refinement) with the FULLPROF software package [31]. To study atomic structure properties both the whole powder pattern modeling (WPPM) with PM2K software [32,33] and the Rietveld refinement with MAUD software [34] were carried out in order to confirm the validity of the obtained data.…”
Section: B the Wide-angle X-ray Diffractionmentioning
confidence: 99%
“…Also, different types of defects are likely to coexist in the samples, e.g., dislocations as well as stacking faults. The analysis with WPPM and PM2K software [34] together with Rietveld refinement with MAUD software [32,33] was applied for every sample. As a result, a rough estimation of microstrains, crystallite sizes, and stacking fault probabilities was performed and cross checked using two methods mentioned above.…”
Section: Microstructure Of the Nickel Polycrystalline Frameworkmentioning
confidence: 99%
“…The low angle XRD data was refined for the peaks indicated in Fig. 1, following the Rietveld method with the MAUD software 17 and using ICSD data base. The low angle diffraction curve was obtained about one year after 18 the diffraction curve presented in the inset of Fig.…”
Section: Copyright 2012 Author(s) This Article Is Distributed Under mentioning
confidence: 99%