2017 IEEE 30th International Conference on Microelectronics (MIEL) 2017
DOI: 10.1109/miel.2017.8190119
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Total Ionizing Dose Degradation of CMOS 8-transistor Image Sensor with Column ADC

Maksim E. Cherniak
1
,
Anatoly A. Smolin
2
,
R. K. Mozhaev
3
et al.
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