2021
DOI: 10.1103/physrevmaterials.5.014203
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Topological surface states in epitaxial (SnBi2Te4)n(Bi2Te3

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Cited by 11 publications
(20 citation statements)
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“…Details of the epitaxial growth and material characterization may be found in Section S1, Supporting Information and ref. [14].…”
Section: Materials Characterizationmentioning
confidence: 99%
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“…Details of the epitaxial growth and material characterization may be found in Section S1, Supporting Information and ref. [14].…”
Section: Materials Characterizationmentioning
confidence: 99%
“…However, for SnBi 2 Te 4 thickness larger than 5 SL, the gap closes due to an overlap between conduction and the valence band. [14] Specially prepared sample 5 SL SnBi 2 Te 4 with a 20 nm thick Te capping was measured at the "CASSIOPEE" beamline of SOLEIL synchrotron facility after capping removal, with horizontally polarized light and a photon energy of 27 eV in order to visualize the band structure and the Fermi surface of SnBi 2 Te 4 . The measurements were carried out at the temperature of 15 K and an energy resolution of 15 meV with a polar angle step of 0.2°.…”
Section: Tss Characterizationmentioning
confidence: 99%
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