2012
DOI: 10.1209/0295-5075/97/67006
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Top-gate LZTO thin-film transistors with PMMA gate insulator by solution process

Abstract: Top-gate thin-film transistors (TFTs) with indium-free multicomponent amorphous lanthanum-zinc-tin-oxide (a-LZTO) as channel layer and organic poly (methylmethacrylate) (PMMA) as dielectric layer were prepared by the solution process of the dip coating method. X-ray photoelectron spectroscopy (XPS) verified that the oxygen-vacancy-related O1s peak decreased with increasing La content. Moreover, the addition of La 3+ caused the band gap of LZTO films to broaden. The results indicate that La atoms acted as a car… Show more

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Cited by 16 publications
(10 citation statements)
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“…When La loading into the SnO film was 1.9 atom %, the E g opt value for the 1.9 atom % La-loaded SnO film increased to 2.73 eV, which is consistent with its enhanced optical transmittance (also see Table ). This blue shift can be supported by the fact that the E g value (∼5.5 eV) of La 2 O 3 is considerably larger than that of SnO (in this work, 2.66 eV). , Conversely, a significant reduction in E g opt (∼1.91 eV) was observed for the 3.1 atom % La-loaded SnO film. The origin of this abnormal behavior is not clear.…”
Section: Resultssupporting
confidence: 58%
“…When La loading into the SnO film was 1.9 atom %, the E g opt value for the 1.9 atom % La-loaded SnO film increased to 2.73 eV, which is consistent with its enhanced optical transmittance (also see Table ). This blue shift can be supported by the fact that the E g value (∼5.5 eV) of La 2 O 3 is considerably larger than that of SnO (in this work, 2.66 eV). , Conversely, a significant reduction in E g opt (∼1.91 eV) was observed for the 3.1 atom % La-loaded SnO film. The origin of this abnormal behavior is not clear.…”
Section: Resultssupporting
confidence: 58%
“…Figure shows the O 1s regions of XPS spectra of TSO thin films with Si doping content from 0 to 8.5 at.%. By Lorentzian–Gaussian fitting, the O 1s peaks are divided into three peaks O L , O M , and O H centered at 530.5, 531.8, and 532.7 eV respectively, reflecting different oxygen environments . The low‐energy peak (O L ) centered at 530.5 eV is associated with oxygen ions combined with Sn ions whereas the mid‐binding energy peak (O M ) at 531.8 eV arises from the oxygen vacancies within the TSO thin films.…”
Section: Resultsmentioning
confidence: 99%
“…2(a) and (b), the reverse current decreses with the increasing GO content from 2 to 6%. This might be attributed to reduction of carrier concentration caused by the addition of GO charge carrier [22][23][24][25].…”
Section: Current-voltage Characteristics Of the Diodesmentioning
confidence: 99%