2017
DOI: 10.1002/smll.201603157
|View full text |Cite
|
Sign up to set email alerts
|

Top‐Down Integration of Molybdenum Disulfide Transistors with Wafer‐Scale Uniformity and Layer Controllability

Abstract: in logic circuits and CMOS applications. In particular, mono layer MoS 2 has a direct band gap of 1.9 eV, which makes it promising for optoelectronics applications such as photode tector or light emission diode (LED). [2] To date, most experimental research focus on the 2D sem iconductors mechanically exfoliated from bulk material, sim ilar to the approach for graphene studies. This is because the mechanical exfoliation (mostly "scotch tape" method) not only enables a high quality single crystal 2D semiconduct… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2

Citation Types

1
58
0

Year Published

2018
2018
2023
2023

Publication Types

Select...
8

Relationship

1
7

Authors

Journals

citations
Cited by 51 publications
(59 citation statements)
references
References 39 publications
(98 reference statements)
1
58
0
Order By: Relevance
“…32 High-temperature sulfurization of thickness-controlled MoO 3 by ALD is also a useful approach to obtain high-quality MoS 2 . 10,33 Although these approaches produced promising materials, the high reaction temperatures required as well as high sulfurization temperature still hindered the progress of ALD-MoS 2 . Therefore, it is essential to develop an ALD process at low-temperature, which is more adaptive for temperature-sensitive substrates such as polymeric substrates and further facilitates device fabrication.…”
Section: Introductionmentioning
confidence: 99%
“…32 High-temperature sulfurization of thickness-controlled MoO 3 by ALD is also a useful approach to obtain high-quality MoS 2 . 10,33 Although these approaches produced promising materials, the high reaction temperatures required as well as high sulfurization temperature still hindered the progress of ALD-MoS 2 . Therefore, it is essential to develop an ALD process at low-temperature, which is more adaptive for temperature-sensitive substrates such as polymeric substrates and further facilitates device fabrication.…”
Section: Introductionmentioning
confidence: 99%
“…Yet for practical application, wafer‐scale synthesis of high‐quality, continuous MoS 2 film is highly desired. Recently, the chemical vapor deposition (CVD) technique has been applied to produce single‐layer (1L) MoS 2 films with moderate electrical performance and so far the largest number of logic gates is 115 . Mechanically exfoliated multilayer (ML) MoS 2 have shown improved mobility and drive currents because of thicker channel with higher density of states .…”
mentioning
confidence: 99%
“…Similarly, transition metal oxide was used as a predeposited thin film prior to obtaining a 2D TMD thin film . For instance, Shi et al reported the growth of a MoS 2 thin film on a sapphire substrate by sulfurizing the MoO 3 film deposited by ALD, showing that MoS 2 films with the desired thickness can be obtained by varying the MoO 3 ALD cycle ( Figure a) . As the number of cycles of ALD increased, the thickness gradually increased from 0.7 to 2.74 nm, as shown in Figure b.…”
Section: Electronic Transport Devicesmentioning
confidence: 99%
“…In the OM images, the brighter region is MoS 2 , and the darker region is the sapphire substrate. Reproduced with permission . Copyright 2017, Wiley‐VCH Verlag GmbH & Co. KGaA.…”
Section: Electronic Transport Devicesmentioning
confidence: 99%