Tomographic reconstruction of multiple in-line electron holograms of realistic objects

Rothwell, Timothy A.; Shegelski, Mark R. A.

doi:10.1016/j.micron.2004.06.006

Cited by 4 publications

(3 citation statements)

References 31 publications

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“…However, since the introduction of the point electron source the resolution of images of biological molecules has remained at about 2 nm (Spence et al ., 1994a; Fink et al , 1997; Eisele et al , 2008), despite the fact that simulations of hologram formation and reconstruction suggest that near atomic resolution should be possible. For example, by simulating hologram formation by the method of partial wave analysis of electron eigenstates, and reconstructing the original object from the hologram by means of the Fresnel–Kirchoff transform (Kreuzer et al ., 1992), holograms of crystalline arrays can be reconstructed to give faithful three‐dimensional representations of the original atomic structure (Rothwell & Shegelski, 2005). Simulations of holograms of larger molecules have also been made, including those of a double helix made up of carbon atoms (Fink & Schmid, 1994) and a filamentous polymer, which was reconstructed to show the fine structure of repeating units of the molecule (Gölzhäuser et al , 2002).…”

Section: Introductionmentioning

confidence: 99%

Resolving power of lens‐less low energy electron point source microscopy

Stevens

2009

Journal of Microscopy

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SummarySimulations show the resolving power of lens-less low energy electron point source microscopy to be approximately 15 Å for electron energies of between 14 and 105 eV. This resolution can be improved to 10 Å by employing a composite hologram method. However, these values fall short of predictions of at least 3 Å resolution for electron energies in this range because the limited divergence angle of the electron beam had not previously been taken into account. Also shown is that electron coherence from field emitting tips that terminate in a single atom will not limit the resolving power as much as the beam divergence angle. The penetration depth of electrons with energies of between 50 and 100 eV, into biological molecules, was estimated from the inelastic mean free path length to be 25 Å . This places an upper limit on the size of biological molecules for which internal structural information can be obtained using low energy electrons.

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Section: Introductionmentioning

confidence: 99%

Resolving power of lens‐less low energy electron point source microscopy

Stevens

2009

Journal of Microscopy

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“…Other theories of electron holography include the Green's function formalism [7,8,20], the Kirchhoff-Helmholtz integral [21,22], and other methods [23,24]. A noteworthy fact emanating from the literature is that the reconstruction of electron holograms can be performed more or less by straightforward formulas [7,21,25,26], while the reconstruction of simple diffractograms (in which the scattered wave does not interfere with the reference wave) usually involves iterative procedures and an initial guess of the object function [27,28].…”

Section: Theory For Simulating and Reconstructing Electron Hologramsmentioning

confidence: 99%

In-line holographic electron microscopy in the presence of external magnetic fields

2008

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“…Bardon et al [18] achieved with the LEEPS microscope on MgO crystallites a better resolution than with their conventional scanning electron microscope (SEM). A theoretical group predicts even atomic resolution for LEEPS microscopy on certain cluster by a tomographic approach [19][20][21]. Improvements in the reconstruction of holographic images were achieved by a novel approach to solve the twin-image problem [22].…”

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confidence: 99%

Characterization of nanowires with the low energy electron point source (LEEPS) microscope

Beyer

Weber

Völkel

2010

Physica Status Solidi (b)

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The low energy electron point source (LEEPS) microscope is an instrument for the characterization of structural, electrical, and mechanical properties of single molecules and nanostructures. In this work, we review our efforts in advancing LEEPS as tool for the characterization of electric properties of nanowires. Individual nanowires of different size and material were examined, including compositions of metallic as well as semiconducting character. The nanowires were characterized by electrical conductance measurements with a metallic tip as movable electrode and the sample support as its counterpart. Beyond these measurements, we developed a scheme to deduce the electrical conductivity of a single nanowire directly from its LEEPS image. This substantially reduces the data acquisition time and widens the applicability of LEEPS microscopy.

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Tomographic reconstruction of multiple in-line electron holograms of realistic objects

Cited by 4 publications

References 31 publications

Resolving power of lens‐less low energy electron point source microscopy

Resolving power of lens‐less low energy electron point source microscopy

In-line holographic electron microscopy in the presence of external magnetic fields

Characterization of nanowires with the low energy electron point source (LEEPS) microscope

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