Artificial Neural Networks 1991
DOI: 10.1016/b978-0-444-89178-5.50050-6
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Tolerance of a Binary Associative Memory Towards Stuck-at-Faults

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Cited by 10 publications
(9 citation statements)
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“…Iterative retrieval in the Willshaw model (2) can be described by the Lyapunov function (12) since it is easy to show that asynchronous application of the Willshaw update in (2) sets to if (13) We call the method for setting the threshold during the course of iterations the threshold strategy.…”
Section: A Retrieval As Constraint Satisfactionmentioning
confidence: 99%
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“…Iterative retrieval in the Willshaw model (2) can be described by the Lyapunov function (12) since it is easy to show that asynchronous application of the Willshaw update in (2) sets to if (13) We call the method for setting the threshold during the course of iterations the threshold strategy.…”
Section: A Retrieval As Constraint Satisfactionmentioning
confidence: 99%
“…The Lyapunov function (14) is equivalent (up to a constant factor and a constant offset) to (12) for . The terms in (14) can be interpreted as constraint terms on : The first term punishes pairs of 1-components in that coincide with a matrix element .…”
Section: A Retrieval As Constraint Satisfactionmentioning
confidence: 99%
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“…The basic operation of NAMs (Kohonen 1984) are pattern mapping (heteroassociative recall) and pattern completion (autoassociative recall). In addition NAMs have the capability of fault tolerance as described in Palm (1982), Rückert and Surmann (1991), and Kohonen (1984). There are two phases in working with NAMs.…”
Section: Associative Memory With Neural Architecturementioning
confidence: 99%
“…Thus, these systems have to be designed carefully in order to guarantee reliable operation under changing and noisy environment. In order to fulfill these requirements neural networks have to be fault-tolerant to malfunctioning neurons [2] and to be robust to noise corrupted weights and inputs [4]. Technical implementations have always to face malfunctioning elements [5], especially in future nanoelectronic realizations [6] and noise is always present [7][8][9].…”
Section: Introductionmentioning
confidence: 99%