TOF‐SIMS VG Ionex IX23LS: upgrade and application for the urinary stones analysis

Abstract

TOF-SIMS VG Ionex IX23LS with upgraded data acquisition and control system was used to study the real urinary stones along with calcium oxalate (COX) and four different calcium phosphate (CP) references. Reliable phase identification of CPs was achieved in the positive SIMS mode on basis of the PO + /POH + and CaPO 2 + /Ca 2 O + peak ratios. In real urinary stones, pure COX was distinguished from calcium phosphates with confidence via the presence of its characteristic ion peaks. We also quantified the calcium phosphate in the human calculi containing calcium oxalate as major or minor component, which is of a great interest for medical community.

Chitosan–Hydroxyapatite Composite Layers Generated in Radio Frequency Magnetron Sputtering Discharge: From Plasma to Structural and Morphological Analysis of Layers

“…Typical calcium phosphate fragments: CaP + (71,048 m/z ), CaPO + (86.9 m/z ), CaPO 3 + (118,8 m/z ), CaPO 4 + (134,73 m/z ), CaP 2 O 3 + (149,9 m/z ) and Ca 3 PO + (167,19 m/z ), were also detected. Such positive molecular ions specific to calcium phosphate were also identified by time-of-flight secondary ion mass spectrometry analysis of some stones based on calcium phosphate compounds [ 22 , 23 , 24 , 25 , 26 , 27 ].…”

“…Typical calcium phosphate fragments: CaP + (71,048 m/z), CaPO + (86.9 m/z), CaPO 3 + (118,8 m/z), CaPO 4 + (134,73 m/z), CaP 2 O(149,9 m/z) and Ca 3 PO + (167,19 m/z), were also detected. Such positive molecular ions specific to calcium phosphate were also identified by time-of-flight secondary ion mass spectrometry analysis of some stones based on calcium phosphate compounds[22][23][24][25][26][27]. Beside these fragments belonging to hydroxyapatite, we assigned positive ions characteristic of the chitosan chemical structure (C 6 H 11 NO 4 ) n : C 6 H 11 + (83 m/z), (C 6 H 11 NO 4 ) + (160,96 m/z) and NO (77.96 m/z).…”

Sn-deficiency in the electrodeposited ternary CuxSnySz thin films by ECALE

“…TOF-SIMS depth profiling was achieved measuring positive secondary ion spectra in the mass range of 0.5-400 m/z using an upgraded VG Ionex IX23LS TOF-SIMS [27,28]. A focused liquidmetal Ga þ gun MIG 300PB in the pulsed mode (6 kHz/40 ns) was employed as a source of probing ions.…”

Regio‐ and Chemoselective Reduction of Nitroarenes and Carbonyl Compounds over Recyclable Magnetic FerriteNickel Nanoparticles (Fe3O4Ni) by Using Glycerol as a Hydrogen Source

“…The presence of Ni on the surface of ferrite was confirmed with time of flight secondary ion mass spectrometry (TOF‐SIMS), which is the most surface sensitive (<1 nm) and widely used technique for surface characterization. We used VG TOF‐SIMS22 instrument in static mode with primary ions (Ga + ) beam at impact energy of 10 keV. The positive ions spectrum of intact surface in the m / z range 0–100 is shown in Figure 2 a, with diagnostic ions of ferrite observed at m / z =56, 57, and 73 corresponding to 56 Fe + , 56 FeH + , and 56 FeOH + , respectively (Figure 2).…”