TOF-OFF: A method for determining focal positions in tightly focused free-electron laser experiments by measurement of ejected ions

Iwan, Bianca; Andreasson, Jakob; Andrejczuk, A.; Abreu, Elsa; Bergh, M.; Caleman, Carl; Nelson, A. J.; Bajt, Saša; Chalupský, J.; Chapman, Henry N.; Fäustlin, R. R.; Hájková, V.; Heimann, Philip; Hjörvarsson, Bjørgvin; Juha, L.; Klinger, D.; Krzywiński, J.; Nagler, Bob; Pálsson, Gunnar K.; Singer, W.; Seibert, M. Marvin; Sobierajski, R.; Toleikis, S.; Tschentscher, Th.; Vinko, S. M.; Lee, R.W.; Hajdu, János; Tı̂mneanu, Nicuşor

doi:10.1016/j.hedp.2011.06.008

Cited by 9 publications

(7 citation statements)

References 39 publications

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“…5 by the appearance of C, Na and K signal at m/q = 12, 23 and 39 respectively and an accumulation between m/q = 2 and 3 of what likely is highly charged ions accelerated by plasma effects. Significant X-ray driven acceleration of light ions has been observed from solid density samples [18] earlier and was used for an accurate determination of the beam focused beyond the Rayleigh length [19].…”

Section: Identifying Hits Using An Ion Time-of-flight Spectrometermentioning

confidence: 99%

Automated identification and classification of single particle serial femtosecond X-ray diffraction data

Andreasson¹,

Martin²,

Liang³

et al. 2014

Opt. Express

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Abstract:The first hard X-ray laser, the Linac Coherent Light Source (LCLS), produces 120 shots per second. Particles injected into the X-ray beam are hit randomly and in unknown orientations by the extremely intense X-ray pulses, where the femtosecond-duration X-ray pulses diffract from the sample before the particle structure is significantly changed even though the sample is ultimately destroyed by the deposited X-ray energy. Single particle X-ray diffraction experiments generate data at the FEL repetition rate, resulting in more than 400,000 detector readouts in an hour, the data stream during an experiment contains blank frames mixed with hits on single particles, clusters and contaminants. The diffraction signal is generally weak and it is superimposed on a low but continually fluctuating background signal, originating from photon noise in the beam line and electronic noise from the detector. Meanwhile, explosion of the sample creates fragments with a characteristic signature. Here, we describe methods based on rapid image analysis combined with ion Time-of-Flight (ToF) spectroscopy of the fragments to achieve an efficient, automated and unsupervised sorting of diffraction data. The studies described here form a basis for the development of real-time frame rejection methods, e.g. for the European XFEL, which is expected to produce 100 million pulses per hour. ©2014 Optical Society of America

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Section: Identifying Hits Using An Ion Time-of-flight Spectrometermentioning

confidence: 99%

Automated identification and classification of single particle serial femtosecond X-ray diffraction data

Andreasson¹,

Martin²,

Liang³

et al. 2014

Opt. Express

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“…The plasma induced by XUV/SXR pulses is mainly generated as a consequence of the photoeffect (electron-hole or excitonic "plasma") and in less proportion by the collisional absorption, i.e., inverse Bremsstrahlung. 96 Emission spectra from plasmas produced by short 97 as well as ultra-short 98,99 pulses of shortwavelength lasers have been explored in not so many studies. Peculiar observations have been reported, which require more extensive studies in the future.…”

Section: Laser-plasma Emission Spectrometrymentioning

confidence: 99%

“…Mass spectra have also been taken from solid targets ablated by focused XUV and SXR from free-electron lasers. 66,97 Li et al 102 took advantage of the synchrotron VUV tunability to characterize combustion intermediates in premixed ames and those from other systems in combustion research, such as hydrocarbon ames, diffusion ames, plasma and catalytic reactions. Giuliani and colleagues 103,104 studied the application of synchrotron radiation for the photoactivation of ions in the short wavelength region, which is a rapidly growing eld.…”

Section: Laser Mass Spectrometrymentioning

confidence: 99%

Soft X-ray laser ablation for nano-scale chemical mapping microanalysis

Bleiner

Juha

2020

J. Anal. At. Spectrom.

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“…In our previous studies on XFEL-matter interactions [9][10][11][12][13][14] we have used the Cretin software to perform NLTE calculations. The NLTE model was originally developed for low-density warm matter, using a so-called plasma formulation, which is appropriate for samples exposed to high-fluence photon pulses, where the average ionization of the system is high and chemical bonds are of negligible significance.…”

Section: Calculationsmentioning

confidence: 99%

FreeDam – A webtool for free-electron laser-induced damage in femtosecond X-ray crystallography

Jonsson

Östlin

Scott

et al. 2018

High Energy Density Physics

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Over the last decade X-ray Free-Electron Laser (XFEL) sources have been made available to the scientific community. One of the most successful uses of these new machines has been protein crystallography. When samples are exposed to the intense short X-ray pulses provided by the XFELs, the sample quickly becomes highly ionized and the atomic structure is affected. Here we present a webtool dubbed FreeDam based on non-thermal plasma simulations, for estimation of radiation damage in free-electron laser experiments in terms of ionization, temperatures and atomic displacements. The aim is to make this tool easily accessible to scientists who are planning and performing experiments at XFELs.

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TOF-OFF: A method for determining focal positions in tightly focused free-electron laser experiments by measurement of ejected ions

Cited by 9 publications

References 39 publications

Automated identification and classification of single particle serial femtosecond X-ray diffraction data

Automated identification and classification of single particle serial femtosecond X-ray diffraction data

Soft X-ray laser ablation for nano-scale chemical mapping microanalysis

FreeDam – A webtool for free-electron laser-induced damage in femtosecond X-ray crystallography

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