Although
metal phthalocyanines are widely used in optoelectronic
devices, e.g., as hole-transport and electron-blocking layers, or
as UV-stable dyes, their multilayer growth on metal substrates has
surprisingly not been studied very systematically. Even for CuPc,
one of the most widely studied representatives of phthalocyanines,
contradictory structures are reported for films grown on gold, a common
electrode material, suggesting that the influence of actual substrate
surface properties on film growth has not been sufficiently considered.
In this study, we analyze the growth of CuPc films on gold substrates
for thicknesses ranging from the initial seed layer to thick multilayers
(50 nm) by combining near-edge X-ray absorption spectroscopy with
atomic force microscopy and X-ray diffraction. To study the influence
of surface roughness, we compare the formation of CuPc films on well-ordered
Au(111) and sputter-deposited polycrystalline gold substrates and
also investigate the influence of surface contamination by exposing
these gold surfaces to air before film growth. While on clean gold
substrates, CuPc molecules exclusively adopt a recumbent orientation
and form (112̅)-oriented films, they also grow in an upright
orientation on contaminated gold surfaces. On Au(111), this leads
to the coexistence of (112̅)- and (100)-oriented regions, whereas
only (100)-oriented films are formed on contaminated polycrystalline
gold. Remarkably, the (112̅)-oriented films consist of extended
but isolated crystalline islands, resulting in large overall roughness,
whereas the (100)-oriented films consist of rather small domains but
have significantly lower film roughness.