2012
DOI: 10.1016/j.vacuum.2012.06.003
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Titanium film deposition by high-power impulse magnetron sputtering: Influence of pulse duration

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Cited by 57 publications
(20 citation statements)
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“…Such changes are typical for the DCMS to HiPIMS process transition, reflecting the influence of a higher ion density in the HiPIMS case. 18 Similar changes found in our case approve the ion influence in the BPH mode, altering the film structure in the same way. At the same time, the XRD line broadening remains nearly unaffected, implying negligible changes in the average grain size.…”
supporting
confidence: 83%
“…Such changes are typical for the DCMS to HiPIMS process transition, reflecting the influence of a higher ion density in the HiPIMS case. 18 Similar changes found in our case approve the ion influence in the BPH mode, altering the film structure in the same way. At the same time, the XRD line broadening remains nearly unaffected, implying negligible changes in the average grain size.…”
supporting
confidence: 83%
“…More attention was dedicated to the as-deposited starting layers; all titanium samples show similar diffractograms (Figure 6b) [58]. Influences of underlaying surface and deposition conditions will be discussed later.…”
Section: Structural Parametersmentioning
confidence: 99%
“…Simanullang et al [8] used the RFMS technique to successfully obtain a high crystal structure of GaN thin film at a low temperature (≤200 °C). High power impulse magnetron sputtering (HiPIMS) also a part of the magnetron sputtering power supply that has been used to fabricate thin films [12]- [14]. HiPIMs have a significant fraction of ionized sputtered to create a high-performance thick coating, which has improved the thin film consistency even further [15].…”
Section: Introductionmentioning
confidence: 99%