“…Figure 4 b indicates the retention tests of the device at the reading voltage of 0.1 V after the rapid nitrogen annealing treatment, it is appreciable that the R HRS /R LRS of the W/TiO 2 /FTO memory device increased from about two orders of magnitude to three orders of magnitude after the rapid nitrogen annealing treatment. In comparison with the previous reports about TiO 2 memory devices as summarized in Table 1 [ 16 , 17 , 18 , 19 , 21 , 22 , 23 , 24 , 25 , 26 , 27 , 28 , 29 , 31 ], the W/TiO 2 /FTO memory device in this work has a relatively lower V set and the highest resistance ratio of about three orders of magnitude, which demonstrates the outstanding potential of the W/TiO 2 /FTO memory device for the future nonvolatile memory applications.…”