2020
DOI: 10.2478/msp-2020-0043
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TiO2 waveguides thin films prepared by sol-gel method on glass substrates with and without ZnO underlayer

Abstract: TiO2 thin films have been deposited on glass substrates with and without ZnO underlayer by sol-gel dip coating process. XRD patterns show the formation of anatase phase with the diffraction lines (1 0 1) and (2 0 0) in TiO2/glass sample. In TiO2/(ZnO/glass) sample, TiO2 is composed of anatase phase with the diffraction line (2 0 0) but the diffraction peaks of ZnO wurtzite are also well-defined. The determination of the refractive index and the thickness of the waveguiding layers has been performed by m-lines … Show more

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Cited by 14 publications
(3 citation statements)
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“…All lms had four guiding modes (TE 0 , TE 1 , TM 0 , and TM 1 ) two for each optical polarization (Transverse Electric mode (TE) and Transverse Magnetic mode (TM)) as illustrated in Figure 9. Using the dispersion equations for TE and TM polarizations, the optogeometric parameters can be calculated [57][58][59]. The effective indices, the lms thicknesses and the birefringence values are presented in Table 2.…”
Section: M-lines Measurementsmentioning
confidence: 99%
“…All lms had four guiding modes (TE 0 , TE 1 , TM 0 , and TM 1 ) two for each optical polarization (Transverse Electric mode (TE) and Transverse Magnetic mode (TM)) as illustrated in Figure 9. Using the dispersion equations for TE and TM polarizations, the optogeometric parameters can be calculated [57][58][59]. The effective indices, the lms thicknesses and the birefringence values are presented in Table 2.…”
Section: M-lines Measurementsmentioning
confidence: 99%
“…The effective index was evaluated by m-lines spectroscopy using the Snell-Decartes equation of refraction [43]:…”
Section: M-lines Measurementsmentioning
confidence: 99%
“…All films had four guiding modes (TE0, TE1, TM0, and TM1) two for each optical polarization (Transverse Electric mode (TE) and Transverse Magnetic mode (TM)) as illustrated in Figure 9. Using the dispersion equations for TE and TM polarizations, the optogeometric parameters can be calculated [57][58][59]. The effective indices, the films thicknesses and the birefringence values are presented in Table 2.…”
Section: M-lines Measurementsmentioning
confidence: 99%