Abstract:In this paper, a methodology based upon laser stimulation and a comparison of continuous wave and pulsed laser operation will be presented that localizes the fault relevant sites in a fully functional scan chain cell. The technique uses a laser incident from the backside to inject soft faults into internal nodes of a master-slave scan flip-flop in consequence of localized photocurrent. Depending on the illuminated type of the transistors (n- or p-type), injection of a logic ‘0’ or ‘1’ into the master or the sl… Show more
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