2013
DOI: 10.1007/978-3-642-39068-5_56
|View full text |Cite
|
Sign up to set email alerts
|

Time Series Fault Prediction in Semiconductor Equipment Using Recurrent Neural Network

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2019
2019
2019
2019

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 16 publications
0
1
0
Order By: Relevance
“…A number of researchers [40,41] have proposed the analysis of vibration data as a means by which to monitor the status of machines. In this study, we developed a monitoring system based on an inexpensive single chip controller, Arduino, in conjunction with triaxial accelerometers, infrared sensors, and temperature sensors.…”
Section: Add-on Sensors For the Collection Of Data Related To Machinery Statusmentioning
confidence: 99%
“…A number of researchers [40,41] have proposed the analysis of vibration data as a means by which to monitor the status of machines. In this study, we developed a monitoring system based on an inexpensive single chip controller, Arduino, in conjunction with triaxial accelerometers, infrared sensors, and temperature sensors.…”
Section: Add-on Sensors For the Collection Of Data Related To Machinery Statusmentioning
confidence: 99%