2003
DOI: 10.1063/1.1616634
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Time-resolved x-ray diffraction study of the relaxation process of electric-field-induced strain in KD2PO4

Abstract: Articles you may be interested inDomain wall motion and electromechanical strain in lead-free piezoelectrics: Insight from the model system (1 − x)Ba(Zr0.2Ti0.8)O3-x(Ba0.7Ca0.3)TiO3 using in situ high-energy X-ray diffraction during application of electric fields

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Cited by 7 publications
(2 citation statements)
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“…The first X-ray diffraction study of the relaxation processes in piezoelectric crystals has been performed by van Reeuwijk et al [14] The pump-probe based technique and the special time structure of the beam has been used.…”
Section: Time-resolved Studies Of Piezoelectric Crystalsmentioning
confidence: 99%
“…The first X-ray diffraction study of the relaxation processes in piezoelectric crystals has been performed by van Reeuwijk et al [14] The pump-probe based technique and the special time structure of the beam has been used.…”
Section: Time-resolved Studies Of Piezoelectric Crystalsmentioning
confidence: 99%
“…studied the strain in the sector of KDP crystal by using X‐ray morphology technique, and they proposed that the strain came from lattice deformation caused by incorporation of impurities. van Reeuwijk et al . investigated the process of stress release using X‐ray with flying time mode.…”
Section: Introductionmentioning
confidence: 99%