Time resolved studies on X-rays and charged particles emission from a low energy plasma focus device

Neog, N. K.; Mohanty, S. R.; Borthakur, T. K.

doi:10.1016/j.physleta.2007.11.024

Cited by 28 publications

(6 citation statements)

References 24 publications

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“…In a time span of 300 ns, the multi burst structures of soft x-ray emission were corresponded to pinched plasma, breakup of the pinched plasma into hot spots and vaporized copper jet of the anode material [51]. Such complex features of x-ray emission were also observed in 2.2 kJ plasma focus device operated in the nitrogen medium [41] and 3 kJ plasma focus device with hydrogen-argon admixtures [54]. In general, the x-ray components have been reported to be originated from the dense plasma itself, remnant plasma after disruption of pinched plasma or electron beam collision on the anode surface.…”

Section: Resultsmentioning

confidence: 77%

“…The overall results indicate that more than 80% of the discharges were showing multiple voltage spikes at operating pressures below 0.8 mbar. The multiple voltage spikes correspond to multiple plasma compressions that occurred in the background of the remnant plasma after the main compression [41]. The origin of these multiple voltage spikes in the focusing discharge is suggested to be correlated with plasma instabilities and anomalous resistivity effect occurred during the pinching event [32,50].…”

Section: Resultsmentioning

confidence: 91%

“…In order to have clearer understanding on the time evolution of various radiation emissions, Neog et al [41] carried out a simultaneous time resolved measurement on x-ray, ion and electron beam emission. Soft x-ray with a total duration of up to 300 ns were emitted corresponding to different pinch phases, which was analogous with the electron beam emission history.…”

Section: Introductionmentioning

confidence: 99%

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Dynamics of ion beam emission in a low pressure plasma focus device

Lim¹,

Yap²,

Nee³

et al. 2021

Plasma Phys. Control. Fusion

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The plasma that accelerates and compresses in the formation of the pinch in dense plasma focus devices has been found to be an abundant source of multiple radiations like ion beams and x-rays. In this work, the ion beam and x-ray emissions from a 2.7 kJ (13.5 kV, 30 µF) plasma focus device operated at pressure below 1 mbar were investigated. The time profile of the ion beam emission was analysed from the simultaneously measured ion beam, soft and hard x-ray signals using biased ion collectors, BPX 65 silicon PIN diode and a scintillator-photomultiplier tube assembly. Time resolved analysis of the emissions revealed that the emission of the ion beam corresponded to several different pinching instances. Two components of the ion beam were identified. An ion beam of lower energy but higher intensity was emitted followed by an ion beam of higher energy but lower intensity in the first plasma pinch. The ion beam emitted from the first plasma pinch also has higher energy than subsequent plasma pinches. The emission was found to be associated with the amplitude of voltage spike. The results from ion beam and electron beams suggest that they were emitted by the same localized electric field induced in the pinched plasma. The strongest plasma focus discharge indicated by sharp voltage spike of high amplitude and highest ion beam energy were both observed at 0.2 mbar. The average energy of the ion beam obtained is (53 ± 13) keV. At this optimum condition, the ions beam with the highest energy also led to the highest hard x-ray emission.

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Section: Resultsmentioning

confidence: 77%

Section: Resultsmentioning

confidence: 91%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Dynamics of ion beam emission in a low pressure plasma focus device

Lim¹,

Yap²,

Nee³

et al. 2021

Plasma Phys. Control. Fusion

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“…A short-lived (50 ns-100 ns), high-temperature, and high density compressed plasma is produced in a variety of plasma focus (PF) devices by a strong and self-generated magnetic field. The PF devices can emit intensive ion-and electronbeams, [1][2][3][4][5] soft and hard X-rays, [6][7][8][9] and neutron beams. [10] The radiation and emission from these plasmas have a wide range of applications in many fields such as pulsed activation analysis through the use of neutrons, [11] lithography, microlithography, and microscopy.…”

Section: Introductionmentioning

confidence: 99%

Energy spectrum of multi-radiation of X-rays in a low energy Mather-type plasma focus device

Aghamir¹,

Behbahani²

2014

Chinese Phys. B

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“…More than three decades of research on plasma focus (PF) devices, ranging from low to high energies, has introduced this device as a cost-effective and simple source of intensive ion and electron beams (Stygar et al 1982;Kelly and Marquez 1995;Wong et al 2002;Patran et al 2005;Mohanty et al 2007), soft and hard X-rays (Rawat et al 2004;Wong et al 2004;Neog et al 2006Neog et al , 2008 as well as neutron beams (Verma et al 2008). Due to a wide range of applications of high-energy, short-pulse electron beams in industry and medical sciences, such as lithography, micro-lithography, microscopy (Neff et al 1989;Lee et al 1997;Mohanty et al 2006), sterilization (Kotov and Sokovnin 2000), and deposition of various thin films (Zhang et al 2005), studies have been undertaken to characterize the electron beam emission and its energy spectrum in dense PF devices.…”

Section: Introductionmentioning

confidence: 99%

Post-pinch generation of electron beam in a low energy Mather-type plasma focus device

Behbahani¹,

Aghamir²

2013

J. Plasma Phys.

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The post-pinch generation of electron beam in a low energy Mather-type plasma focus (PF) device has been investigated. A fast-calibrated Rogowski coil was used to monitor the emission of electron beam. A two-channel diode X-ray spectrometer along with suitable filters provided the records of energy spectrum of X-ray radiation. Single time-period emissions of electron beam with duration of 100 to 20 ns were recorded in the high range of the device operating pressure (0.8-2 mbar). However, in the low range regime (0.2-0.8 mbar), occurrence of single spike electron beam with duration of 150 ± 50 ns, as well as multi-emission of electrons with duration of 400 ± 50 ns, was visible. A multi-peak of tube voltage along with multi-time-period radiation of X-rays dominated by copper lines (Cuk α and Cuk β ) was noticeable in the low-pressure range. The generated electron beam during the post-pinch phase of anomalous resistances is suspected to be the main source of X-ray radiation. This can also be related to the turbulence of the plasma column during the occurrence of anomalous resistances.

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Time resolved studies on X-rays and charged particles emission from a low energy plasma focus device

Cited by 28 publications

References 24 publications

Dynamics of ion beam emission in a low pressure plasma focus device

Dynamics of ion beam emission in a low pressure plasma focus device

Energy spectrum of multi-radiation of X-rays in a low energy Mather-type plasma focus device

Post-pinch generation of electron beam in a low energy Mather-type plasma focus device

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