1999
DOI: 10.1109/20.750620
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Time resolved Kerr microscopy: Magnetization dynamics in thin film write heads

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Cited by 32 publications
(8 citation statements)
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“…This method is now well established and widely used for investigations in magnetic thin films and recording heads. [12][13][14][15][16][17] Other experiments using scanning Kerr microscopy focus onto the eigenmodes of the magnetization in magnetic elements 18 and the gyrotropic motion of a central vortex in magnetic thin film elements. 19 In addition to the magneto-optical methods other time-resolved imaging techniques, namely, time-resolved x-ray photoemission electron microscopy ͑XPEEM͒ and magnetic transmission x-ray microscopy ͑MTXM͒ demonstrated great potential [20][21][22][23][24][25] and were used for similar studies.…”
Section: Introductionmentioning
confidence: 99%
“…This method is now well established and widely used for investigations in magnetic thin films and recording heads. [12][13][14][15][16][17] Other experiments using scanning Kerr microscopy focus onto the eigenmodes of the magnetization in magnetic elements 18 and the gyrotropic motion of a central vortex in magnetic thin film elements. 19 In addition to the magneto-optical methods other time-resolved imaging techniques, namely, time-resolved x-ray photoemission electron microscopy ͑XPEEM͒ and magnetic transmission x-ray microscopy ͑MTXM͒ demonstrated great potential [20][21][22][23][24][25] and were used for similar studies.…”
Section: Introductionmentioning
confidence: 99%
“…We have used ultra fast time-resolved scanning Kerr microscopy [7] with a time resolution of 5 ps and a spatial resolution of 300 nm to characterize the magnetization reversal in the SUL subjected to the write field. To evaluate the magneto-dynamic characteristics under device conditions either the SUL or the full medium stack including the SUL were directly deposited on the ABS of a pole head using a nonmagnetic spacer layer to emulate flying height ( Fig.…”
Section: Methodsmentioning
confidence: 99%
“…Heidmann et al also use time-resolved magnetic microscopy in characterizing thin film magnetic recording devices [72]. As well as measuring the time-resolved flux response (polar mode) at the gap in different geometries, Fig.…”
Section: Magnetic Device Characterization and Nonrepetitive Processesmentioning
confidence: 99%