Time-resolved in-situ investigation of Co-nitride thin film growth by grazing incidence X-ray absorption spectroscopy

Braun, F.; Eckelt, Franz; Voss, Lukas; Rothweiler, Patrick; Lützenkirchen‐Hecht, Dirk

doi:10.1016/j.radphyschem.2022.110707

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Grazing Incidence X-ray Diffraction (Gixrd)1

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2023

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“…In situ and time-resolved studies can be performed during thin-film growth or the tuning of the environmental conditions (temperature, pressure and reactive atmosphere), providing real-time information on the structural evolution of the film. By monitoring the changes in the diffraction patterns during film deposition or under external stimuli, researchers can investigate the growth kinetics, phase transformations, and dynamic processes occurring in thin films [199,200].…”

Section: Grazing Incidence X-ray Diffraction (Gixrd)mentioning

confidence: 99%

Advances in Structural and Morphological Characterization of Thin Magnetic Films: A Review

Aich,

Meneghini,

Tortora

2023

Materials

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The present review places emphasis on a comprehensive survey of experimental techniques to probe the structural and morphological features at the nanoscale range in thin magnetic films, incorporating those available at in-house laboratories as well as those at state-of-the-art synchrotron radiation facilities. This elucidating the range of available techniques, and the information they can yield represents a step for advancing the understanding of and for unlocking new possibilities in the design and optimization of thin magnetic films across a wide range of applications.

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Section: Grazing Incidence X-ray Diffraction (Gixrd)mentioning

confidence: 99%