2010
DOI: 10.1063/1.3272827
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Time resolved imaging of carrier and thermal transport in silicon

Abstract: We use ultrashort optical pulses to microscopically image carrier and thermal diffusion in two spatial dimensions in pristine and mechanically polished surfaces of crystalline silicon. By decomposing changes in reflectivity in the latter sample into a transient component that varies with delay time and a steady-state component that varies with pump chopping frequency, the influence of thermal diffusion is isolated from that of carrier diffusion and recombination. Additionally, studies using carrier injection d… Show more

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Cited by 23 publications
(19 citation statements)
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“…The decay of the pump-probe antenna modulation is governed by cooling of the heated area on a time scale of ∼250 ps [40]. The high repetition frequency of our setup results in a stationary background temperature over a larger, micrometer-sized area [41], which provides the pure ITO signal in Figs. 1 and 2.…”
mentioning
confidence: 99%
“…The decay of the pump-probe antenna modulation is governed by cooling of the heated area on a time scale of ∼250 ps [40]. The high repetition frequency of our setup results in a stationary background temperature over a larger, micrometer-sized area [41], which provides the pure ITO signal in Figs. 1 and 2.…”
mentioning
confidence: 99%
“…A similar design of the scanning system used with the 4f confocal setup makes use of two motorized linear stages instead of the biaxial rotation stage [43]. This system is somewhat easier to align than the setup described above.…”
Section: Scanning Systemmentioning
confidence: 97%
“…Lateral scanning is achieved through an optical two-lens lever. 37 Small changes in reflectivity of the probe beam DR/R ranging from 10 À5 to 10 À3 are measured using lock-in amplification of the photodiode voltage signal. We also present a few examples that use a modified version of this setup.…”
Section: Methodsmentioning
confidence: 99%