Time-resolved high-resolution transmission electron microscopy and high-angle annular dark field scanning transmission electron microscopy of metal-mediated crystallization of amorphous germanium films

Tanaka, Nobuo; Kawahara, Michiharu

doi:10.1016/s0921-5093(00)01900-6

Cited by 4 publications

(2 citation statements)

References 14 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…of the objective lens was successfully performed by using well-known Zemlin tab-leaux~Zemlin et al, 1977! Tanaka et al, 2001a;Tanaka & Kawahara, 2001b!. Then correction of the parameters into the optimum values was performed automatically using a LINUX computer monitored through GUI on a WINDOWS computer.…”

Section: Electron Microscopymentioning

confidence: 99%

See 1 more Smart Citation

First Observation of In_xGa_1−xAs Quantum Dots in GaP by Spherical-Aberration-Corrected HRTEM in Comparison with ADF-STEM and Conventional HRTEM

et al. 2004

Self Cite

View full text Add to dashboard Cite

In(x)Ga(1-x)As quantum dots in GaP(100) crystals prepared by the OMVPE technique are observed along the [011] direction with a newly developed 200-kV spherical aberration(Cs)-corrected HRTEM, a 200-kV annular dark-field (ADF)-STEM, and a 200-kV conventional HRTEM equipped with a thermal field-emission gun. The dots are 6-10 nm in size and strongly strained due to the misfit of about 9% with the GaP substrate and GaP cap layer. All of the cross-sectional high-resolution electron micrographs show dumbbell images of Ga and P atomic columns separated by 0.136 nm in well-oriented and perfect GaP areas, but the interpretable images are limited to those taken with the Cs-corrected HRTEM and ADF-STEM with Fourier filtering of the images. The Cs-corrected HRTEM and ADF-STEM are comparable from the viewpoint of interpretable resolution. A detailed comparison between the Cs-corrected HRTEM images and the simulated ones with electron incidence tilted by 1 degree to 5 degrees from the [011] zone axis gives information on local lattice bending in the dots from the images around 0.1 nm resolution. This becomes one of the useful techniques newly available from electron microscopy with sub-angstrom resolution.

show abstract

Section: Electron Microscopymentioning

confidence: 99%

“…with a thermal field emission gun and a scanning system~ASID-20; JEOL! Tanaka et al, 2001a;Tanaka & Kawahara, 2001b!. The annular dark-field detector for ADF-STEM ranges from 40 to 110 mrad.…”

Section: Electron Microscopymentioning

confidence: 99%

First Observation of In_xGa_1−xAs Quantum Dots in GaP by Spherical-Aberration-Corrected HRTEM in Comparison with ADF-STEM and Conventional HRTEM

et al. 2004

Self Cite

View full text Add to dashboard Cite

show abstract

Fractal nature of surface topography and physical properties of the coatings obtained using magnetron sputtering

Kwaśny

Dobrzański

Pawlyta

et al. 2004

Journal of Materials Processing Technology

View full text Add to dashboard Cite

Structure, physical properties and fractal character of surface topography of the Ti+TiC coatings on sintered high speed steel

Kwaśny

Dobrzański

2005

Journal of Materials Processing Technology

View full text Add to dashboard Cite

Time-resolved high-resolution transmission electron microscopy and high-angle annular dark field scanning transmission electron microscopy of metal-mediated crystallization of amorphous germanium films

Cited by 4 publications

References 14 publications

First Observation of In_xGa_1−xAs Quantum Dots in GaP by Spherical-Aberration-Corrected HRTEM in Comparison with ADF-STEM and Conventional HRTEM

First Observation of In_xGa_1−xAs Quantum Dots in GaP by Spherical-Aberration-Corrected HRTEM in Comparison with ADF-STEM and Conventional HRTEM

Fractal nature of surface topography and physical properties of the coatings obtained using magnetron sputtering

Structure, physical properties and fractal character of surface topography of the Ti+TiC coatings on sintered high speed steel

Contact Info

Product

Resources

About

Time-resolved high-resolution transmission electron microscopy and high-angle annular dark field scanning transmission electron microscopy of metal-mediated crystallization of amorphous germanium films

Cited by 4 publications

References 14 publications

First Observation of InxGa1−xAs Quantum Dots in GaP by Spherical-Aberration-Corrected HRTEM in Comparison with ADF-STEM and Conventional HRTEM

First Observation of InxGa1−xAs Quantum Dots in GaP by Spherical-Aberration-Corrected HRTEM in Comparison with ADF-STEM and Conventional HRTEM

Fractal nature of surface topography and physical properties of the coatings obtained using magnetron sputtering

Structure, physical properties and fractal character of surface topography of the Ti+TiC coatings on sintered high speed steel

Contact Info

Product

Resources

About

First Observation of In_xGa_1−xAs Quantum Dots in GaP by Spherical-Aberration-Corrected HRTEM in Comparison with ADF-STEM and Conventional HRTEM

First Observation of In_xGa_1−xAs Quantum Dots in GaP by Spherical-Aberration-Corrected HRTEM in Comparison with ADF-STEM and Conventional HRTEM