2015
DOI: 10.1002/rcm.7210
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Time‐of‐flight secondary ion mass spectrometry imaging of biological samples with delayed extraction for high mass and high spatial resolutions

Abstract: RationaleIn Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS), pulsed and focused primary ion beams enable mass spectrometry imaging, a method which is particularly useful to map various small molecules such as lipids at the surface of biological samples. When using TOF‐SIMS instruments, the focusing modes of the primary ion beam delivered by liquid metal ion guns can provide either a mass resolution of several thousand or a sub‐µm lateral resolution, but the combination of both is generally not possib… Show more

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Cited by 88 publications
(91 citation statements)
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“…A second setting mode of the primary ion column was then used to record an image over an area of 100 Φm × 100 Φm with a spatial resolution of 400 nm, but with only a nominal mass resolution. In that case, the primary ion dose was 1.0 × 10 12 ions·cm −2 (a more recent method using a delayed extraction of the secondary ions enables this spatial resolution of 400 nm while keeping a mass resolution of several thousand) [19]. In all cases, a low energy electron flood gun (20 eV) was activated between two pulses of the primary ion beam to neutralize any charge on the surface of the samples.…”
Section: Tof-sims (Time-of-flight Secondary Ion Mass Spectrometry)mentioning
confidence: 99%
“…A second setting mode of the primary ion column was then used to record an image over an area of 100 Φm × 100 Φm with a spatial resolution of 400 nm, but with only a nominal mass resolution. In that case, the primary ion dose was 1.0 × 10 12 ions·cm −2 (a more recent method using a delayed extraction of the secondary ions enables this spatial resolution of 400 nm while keeping a mass resolution of several thousand) [19]. In all cases, a low energy electron flood gun (20 eV) was activated between two pulses of the primary ion beam to neutralize any charge on the surface of the samples.…”
Section: Tof-sims (Time-of-flight Secondary Ion Mass Spectrometry)mentioning
confidence: 99%
“…One attempt to improve mass resolution in TOF-SIMS using Ar-GCIB involves applying delayed extraction, an essential technique in TOF mass spectrometry. [17][18][19][20][21][22][23][24][25][26][27][28] In the conventional static extraction mode (standard mode) of TOF-SIMS analysis, the width of the primary ion pulse directly affects the start accuracy of the TOF measurement, regardless of whether the analysis is performed with Ar-GCIB or with a liquid metal ion gun. This is because the pulsed primary ions desorb the secondary ions while the extraction field is already switched on, as shown in Scheme 1(a).…”
Section: Resultsmentioning
confidence: 99%
“…Another mode of operation could be used, which combines a higher spatial resolution of ca 400 nm and a mass resolution of M/ΔM = 8 × 10 3 , thanks to a delayed extraction of the secondary ions. 43 However in the present case the "high-current bunched mode" was preferred because it ensures the fastest acquisition time. Under these conditions, the fluence (also called the primary ion dose density) was maintained at 5.0 × 10 11 ions cm −2 , which is below the so-called static SIMS limit.…”
Section: Tof-sims Imagingmentioning
confidence: 92%
“…Consequently, in this mode the pixel stepsize was smaller than the beam diameter (2 μm), leading to oversampling. Another mode of operation could be used, which combines a higher spatial resolution of ca 400 nm and a mass resolution of M /Δ M = 8 × 10 3 , thanks to a delayed extraction of the secondary ions . However in the present case the “high‐current bunched mode” was preferred because it ensures the fastest acquisition time.…”
Section: Methodsmentioning
confidence: 99%