2008
DOI: 10.1063/1.2796173
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Time-of-flight analyzer system to detect reflected particles from a solid surface following low-energy particle injection

Abstract: We have developed a time-of-flight analyzer to measure energy distributions of reflected particles from solid surfaces bombarded by low-energy (1–2keV) ions. The analyzer yields energy distributions of neutrals which can be compared with the energy distributions of charged particles measured by a magnetic deflection-type momentum analyzer. We have tested the system to measure the angular dependence of energy and intensity for neutrals reflected from a polycrystalline W target. The energies of the reflected neu… Show more

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Cited by 4 publications
(10 citation statements)
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“…The energies of reflected particles were smaller than those of the incident particles, due to the energy losses by multiple scattering inside the target surface layer. This trend is very similar to the ones reported for polycrystalline metal samples [13,14]. The dependence of the particle energy and intensity upon the incident angle is shown in Fig.…”
Section: Resultssupporting
confidence: 86%
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“…The energies of reflected particles were smaller than those of the incident particles, due to the energy losses by multiple scattering inside the target surface layer. This trend is very similar to the ones reported for polycrystalline metal samples [13,14]. The dependence of the particle energy and intensity upon the incident angle is shown in Fig.…”
Section: Resultssupporting
confidence: 86%
“…We employed two fixed TOFA systems as shown in Fig. 2(a): 0°-TOFA along with the axis of the incident beam for the time calibration and 45°-TOFA aligned at 45°with respect to the incident beam [14]. The TOFA may detect the neutrals of down to a few hundreds eV.…”
Section: Sample Preparation and Experimental Setupmentioning
confidence: 99%
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