2011
DOI: 10.1002/pssc.201000937
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Time dependence of water‐reducing photocurrent with change of the characteristics of n‐type GaN photo‐illuminated working electrodes

Abstract: Nitride semiconductors are expected for the working electrodes of photoelectrochemical water splitting due to the chemical stability and band‐gap configuration. The p‐type nitrides are stable under photoelectrochemical conditions but the efficiency of light to hydrogen energy is low. The n‐type nitrides have relatively high energy‐conversion especially for the quantum efficiency, but the photoelectrochemical reaction is not stable because of the anodic photocorrosion. In this article, the relationships between… Show more

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Cited by 8 publications
(4 citation statements)
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“…The order of the saturated photocurrent would reflect the number of the recombination center. The higher density of the recombination center was expected for the higher carrier concentration sample [9]. Thus, the lower saturated photocurrent was observed for the higher carrier concentration sample for the 1st cycle.…”
Section: Cyclic Voltammetrymentioning
confidence: 87%
“…The order of the saturated photocurrent would reflect the number of the recombination center. The higher density of the recombination center was expected for the higher carrier concentration sample [9]. Thus, the lower saturated photocurrent was observed for the higher carrier concentration sample for the 1st cycle.…”
Section: Cyclic Voltammetrymentioning
confidence: 87%
“…These time intervals have been generally used in the literature. 17,18 Figure 4 exhibits the photocurrent profile of the photoelectrodes with and without the NiO nano-particles as a function of testing time. In order to demonstrate the significantly enhanced performance as a result of the addition of the NiO nano-particles, a performance index has been used, defined as the ratio of the photocurrent of the photoelectrode with the NiO nano-particles to that without the NiO nanoparticles at each time point (base index 100).…”
mentioning
confidence: 99%
“…33 The fabrication of nanorods and the incorporation of indium into the device will increase the likelihood of device degradation. Recently we reported the use of NiO nanoparticles to prevent this corrosion occurring in multi quantum well devices.…”
Section: Nio Nanoparticlesmentioning
confidence: 99%