Multiresolution deconvolution (MD), based on Tikhonov–Miller regularization and wavelet transformation, was developed and applied to improve the depth resolution of secondary ion mass spectrometry (SIMS) profiles. Both local application of the regularization parameter and shrinking the wavelet coefficients of blurred and estimated solutions at each resolution level in MD provide to smoothed results without the risk of generating artifacts related to noise content in the profile. This led to a significant improvement in the depth resolution. The SIMS profiles were obtained by analysis of delta layers of boron in a silicon matrix using a Cameca-Ims6f instrument. The results obtained by using the MD algorithm are compared to those obtained by monoresolution deconvolution which is Tikhonov–Miller regularization with a model of solution (TMMS). Finally, the advantages and limitations of the MD algorithm are presented and discussed.