“…This is particularly true in SLs where there is mixing of direct and indirect gaps. ETB calculations have been carried out for group IV SLs such as Si/SiGe [119,166,167], Sn/Ge [168,169], for III-V based SLs such as GaAs/AlAs [170][171][172][173][174][175], InAs/GaSb [176][177][178], InAs/AlSb [83], InAs/InSb [179], GaSb/AlSb [180], GaAs/GaAsP [181,182], GaP/AlP [183], for II-VI SLs ZnSe/ZnTe [184], CdTe/HgTe [185][186][187][188], HgCdTe/CdTe [99,189], for mixed SLs made with III-V/IV semiconductors such as GaAs/Ge [190], AlAs/Ge [190], Si/GaP [191], or made with II-VI/IV semiconductors such as ZnS/Si [192], BeSe/Si [193], BeTe/Si [194], BeTe/Ge [194], BeTe/SiGe [194], ZnS/Ge [192], ZnSe/Ge [95,190] and for other SLs as Si/SiO 2 [195], EuS/PbS [196], EuTe/PbTe [196]. We should remember, however, that short-period SLs have also been investigated by ab initio methods [168,[197]…”